Chapter 10: Transmission Electron Microscopy Techniques for Imaging and Compositional Evaluation in Semiconductor Heterostructures and Nanostructures (Contributo in volume (capitolo o saggio))

Type

• Prodotto della ricerca (Classe)
• Contributo in volume (capitolo o saggio) (Classe)

Label

• Chapter 10: Transmission Electron Microscopy Techniques for Imaging and Compositional Evaluation in Semiconductor Heterostructures and Nanostructures (Contributo in volume (capitolo o saggio)) (literal)

Anno

• 2013-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1016/B978-0-444-59551-5.00010-8 (literal)

Alternative label

• Laura Lazzarini 1, Lucia Nasi 1, Vincenzo Grillo 2 (2013)
  Chapter 10: Transmission Electron Microscopy Techniques for Imaging and Compositional Evaluation in Semiconductor Heterostructures and Nanostructures
  Elsevier, Amsterdam (Paesi Bassi) in Characterization of Semicondutor Heterostructures and Nanostructures - 2nd edition, 2013
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Laura Lazzarini 1, Lucia Nasi 1, Vincenzo Grillo 2 (literal)

Pagina inizio

• 413 (literal)

Pagina fine

• 466 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url

• http://www.sciencedirect.com/science/article/pii/B9780444595515000108 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#titoloVolume

• Characterization of Semicondutor Heterostructures and Nanostructures - 2nd edition (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• 1 IMEM-CNR Institute, Parco Area delle Scienze 37/A, 43124 Parma, Italy; 2 Center S3 NANO-CNR, Via Campi, 213/A, 41100 Modena, Italy (literal)

Titolo

• Chapter 10: Transmission Electron Microscopy Techniques for Imaging and Compositional Evaluation in Semiconductor Heterostructures and Nanostructures (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#isbn

• 978-0-444-59551-5 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#curatoriVolume

• Giovanni Agostini and Carlo Lamberti (literal)

Abstract

• Nowadays, the advanced discovery and development of nanometric-scale-structured materials with innovative properties require investigation techniques able to perform characterizations down to the atomic scale. The modern transmission electron microscopes are now able to accomplish this requirement, not only by imaging but also by obtaining chemical information with atomic resolution. This chapter is mainly devoted to a brief introduction to the transmission electron microscopy technique: the fundamentals of the diffraction and phase contrast are explained, with regard to the defect imaging, the chemical-sensitive imaging, the high-resolution electron microscopy with the lattice fringe analysis. The so-called Z-contrast technique for quantitative compositional analysis is concisely outlined as well. At the end, some examples are discussed, to approach the reader to the problems, this technique can solve in the case of quantum well (QW) structures. A typical example of the chemical-sensitive imaging and the interpretation of the strain- and defects-induced contrast is shown in InGaAs-based strain-balanced multi-QWs. A basic application of the lattice fringes analysis for the composition determination is described in the InGaN/GaN system, while it is shown that the In and N assessment in the InGaAsN alloy requires a combination of the diffraction contrast and the lattice fringes analysis. Then, the determination of the exact In content in InGaAs QWs. (literal)

Editore

• Elsevier (Editore)

Prodotto di

• Sviluppo, caratterizzazione strutturale e modelling di strutture avanzate per elettronica (MD.P05.002.001) (Modulo)
• Istituto dei materiali per l'elettronica ed il magnetismo (IMEM) (Istituto)

Autore CNR

• VINCENZO GRILLO (Persona)
• LUCIA NASI (Unità di personale interno)
• LAURA LAZZARINI (Unità di personale interno)

Insieme di parole chiave

• Parole chiave di "Chapter 10: Transmission Electron Microscopy Techniques for Imaging and Compositional Evaluation in Semiconductor Heterostructures and Nanostructures" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• LUCIA NASI (Unità di personale interno)
• VINCENZO GRILLO (Persona)
• LAURA LAZZARINI (Unità di personale interno)

Prodotto

• Istituto dei materiali per l'elettronica ed il magnetismo (IMEM) (Istituto)
• Sviluppo, caratterizzazione strutturale e modelling di strutture avanzate per elettronica (MD.P05.002.001) (Modulo)

Editore di

• Elsevier (Editore)

Insieme di parole chiave di

• Parole chiave di "Chapter 10: Transmission Electron Microscopy Techniques for Imaging and Compositional Evaluation in Semiconductor Heterostructures and Nanostructures" (Insieme di parole chiave)