http://www.cnr.it/ontology/cnr/individuo/prodotto/ID224496
Perpendicular magnetization in epitaxial Cu/Fe/Cu/Si(111) ultrathin films (Articolo in rivista)
- Type
- Label
- Perpendicular magnetization in epitaxial Cu/Fe/Cu/Si(111) ultrathin films (Articolo in rivista) (literal)
- Anno
- 2000-01-01T00:00:00+01:00 (literal)
- Alternative label
G. Gubbiotti(1), G. Carlotti(1), F. D'Orazio(2), F. Lucari(2), R. Gunnella(3) and M. De Crescenzi(3) (2000)
Perpendicular magnetization in epitaxial Cu/Fe/Cu/Si(111) ultrathin films
in Surface science
(literal)
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- G. Gubbiotti(1), G. Carlotti(1), F. D'Orazio(2), F. Lucari(2), R. Gunnella(3) and M. De Crescenzi(3) (literal)
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- ISI Web of Science (WOS) (literal)
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- (1) Dipartimento di Fisica dell'Universita`,INFM,Via Pascoli, I-06100 Perugia, Italy
(2) Dipartimento di Fisica dell'Universita`, INFM,Via Vetoio-Coppito, I-67010 L'Aquila, Italy
(3) Dipartimento di Matematica e Fisica dell'Universita`, INFM,Via Madonna delle Carceri, I-62032 Camerino, Italy (literal)
- Titolo
- Perpendicular magnetization in epitaxial Cu/Fe/Cu/Si(111) ultrathin films (literal)
- Abstract
- Epitaxial Fe films, with thickness in the range between 2.5 and 12A°
, were grown in UHV conditions on the 7×7
reconstructed (111)-Si surface, with a Cu 35A°
thick buffer layer, using the so-called metal-metal epitaxy on silicon
(MMES). Kikuchi electron diffraction showed that the growth of Fe on Cu/Si(111) occurs first by formation of a
pseudomorphic film of c-Fe(111), about two to three atomic layers thick, and by the successive growth of bcc Fe(110)
domains in the Kurdjumov-Sachs orientation, in agreement with our previous low-energy electron diffraction
observations. Kerr effect measurements carried out at low temperatures (20-150 K) revealed that Fe films thinner
than 5-6A° are ferromagnetic with an easy axis magnetization orthogonal to the film plane. With increasing Fe
thickness, in coincidence with the fcc-to-bcc structural transformation, the easy axis switches to the in-plane orientation
over a finite range of thickness (literal)
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