A CRITICAL-EVALUATION OF ELECTROANALYSIS METHODS FOR THE DETERMINATION OF CHROMIUM SPECIES IN PASSIVATION LAYERS ON TINPLATE BY X-RAY PHOTOELECTRON-SPECTROSCOPY (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• A CRITICAL-EVALUATION OF ELECTROANALYSIS METHODS FOR THE DETERMINATION OF CHROMIUM SPECIES IN PASSIVATION LAYERS ON TINPLATE BY X-RAY PHOTOELECTRON-SPECTROSCOPY (Articolo in rivista) (literal)

Anno

• 1984-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1016/0376-4583(84)90137-7 (literal)

Alternative label

• N. AZZERRI, G.M. INGO, C. BATTISTONI, G. MATTOGNO, E. PAPARAZZO (1984)
  A CRITICAL-EVALUATION OF ELECTROANALYSIS METHODS FOR THE DETERMINATION OF CHROMIUM SPECIES IN PASSIVATION LAYERS ON TINPLATE BY X-RAY PHOTOELECTRON-SPECTROSCOPY
  in Surface technology; Elsevier Sequoia, Lausanne (Svizzera)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• N. AZZERRI, G.M. INGO, C. BATTISTONI, G. MATTOGNO, E. PAPARAZZO (literal)

Pagina inizio

• 391 (literal)

Pagina fine

• 404 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 21 (literal)

Rivista

• Surface technology (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 14 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo

• 4 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• N. AZZERRI [1], G.M. INGO [1], C. BATTISTONI [2], G. MATTOGNO [2], E. PAPARAZZO [2] [1] CENTRO SPERIMENTALE METALLURGICO, POB 10747, I-00100 ROME, ITALY [2] CNR,ISTITUTO DI TEORIA & STRUTTURA ELETTRONICA, AREA DELLA RICERCA DI ROMA, CP 10, 00016 MONTEROTONDO STAZIONE, ROME, ITALY. (literal)

Titolo

• A CRITICAL-EVALUATION OF ELECTROANALYSIS METHODS FOR THE DETERMINATION OF CHROMIUM SPECIES IN PASSIVATION LAYERS ON TINPLATE BY X-RAY PHOTOELECTRON-SPECTROSCOPY (literal)

Abstract

• X-ray photoelectron spectroscopy (XPS) was used to analyse, both qualitatively and quantitatively, the passivation film on tinplate samples subjected to the galvanostatic treatments that are usually employed for the quantitative determinations of metallic chromium (the Aubrun test) and of the total chromium amount (the Britton test). It was concluded that neither method has a rigorous quantitative basis or a specific capability for distinguishing between the chromium species. This is explained by chemical transformations (monitored by means of XPS spectra) which play a dominant role in the overall process, relating the total charge passed during the potential arrest to the actual chromium amounts. Tinplate subjected to potentiostatic treatments was also analysed with a view to assessing the potential dependence of the dissolution of the chromium species in the range of interest. Depth profiles were obtained by alternating XPS measurements with Ar + bombardment sequences; particular attention was paid to the evaluation of possible artefacts induced by Ar + ions, mainly preferential removal and reductive effects. © 1984. (literal)

Editore

• Elsevier Sequoia (Editore)

Prodotto di

• Institute of structure of matter (ISM) (Istituto)
• Sintesi e crescita di film e superfici nanostrutturate (PM.P05.004.002) (Modulo)
• Istituto per lo studio dei materiali nanostrutturati (ISMN) (Istituto)

Autore CNR

• GABRIEL MARIA INGO (Unità di personale interno)
• ERNESTO PAPARAZZO (Unità di personale interno)

Insieme di parole chiave

• Keywords of "A CRITICAL-EVALUATION OF ELECTROANALYSIS METHODS FOR THE DETERMINATION OF CHROMIUM SPECIES IN PASSIVATION LAYERS ON TINPLATE BY X-RAY PHOTOELECTRON-SPECTROSCOPY" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• ERNESTO PAPARAZZO (Unità di personale interno)
• GABRIEL MARIA INGO (Unità di personale interno)

Prodotto

• Institute of structure of matter (ISM) (Istituto)
• Istituto per lo studio dei materiali nanostrutturati (ISMN) (Istituto)
• Sintesi e crescita di film e superfici nanostrutturate (PM.P05.004.002) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Surface technology (Rivista)

Editore di

• Elsevier Sequoia (Editore)

Insieme di parole chiave di

• Keywords of "A CRITICAL-EVALUATION OF ELECTROANALYSIS METHODS FOR THE DETERMINATION OF CHROMIUM SPECIES IN PASSIVATION LAYERS ON TINPLATE BY X-RAY PHOTOELECTRON-SPECTROSCOPY" (Insieme di parole chiave)