Ion beam induced reduction of metallic cations in yttria-zirconia (Articolo in rivista)

Type
Label
  • Ion beam induced reduction of metallic cations in yttria-zirconia (Articolo in rivista) (literal)
Anno
  • 1996-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/0168-583X(96)00085-7 (literal)
Alternative label
  • G.M. Ingo, G. Marletta (1996)
    Ion beam induced reduction of metallic cations in yttria-zirconia
    in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (Print); ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, AMSTERDAM (Paesi Bassi)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • G.M. Ingo, G. Marletta (literal)
Pagina inizio
  • 440 (literal)
Pagina fine
  • 446 (literal)
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  • 116 (literal)
Rivista
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  • 7 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 1-4 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • G.M. Ingo [1], G. Marletta [2] [1] Istituto di Chimica dei Materiali-CNR, Area della Ricerca di Roma 1, via Salaria Km 29.3, 00015 Monterotondo, Rome, Italy. [2] Università della Basilicata,DIPARTIMENTO CHIMICA, I-85100 POTENZA, ITALY (literal)
Titolo
  • Ion beam induced reduction of metallic cations in yttria-zirconia (literal)
Abstract
  • Samples consisting in polycrystalline films of 8 wt.% Y2O3-ZrO2, 0.8 mm thick, deposited by plasma spray technique, were irradiated with 1-4 keV Ar ions in the fluence range between 1 x 10(16) and 7 x 10(17) ions/cm(2). The formation of radiation-induced Zr(III) and Zr(II) as well as Y(II) suboxides is demonstrated by using X-ray photoelectron spectroscopy (XPS). In particular, reduced species start to be observed when the energy of the irradiating ions is higher than 1 keV, while the relative amount of the low valence cations produced for a given fluence in the altered layer has been found to depend on the primary ion energy. The results obtained by angular dependent XPS (ADXPS) analysis suggest that the in-depth distribution of the Zr and Y reduced species also depends on the primary ion energy, In particular, for samples irradiated with 2 keV Ar ions the Zr (and Y) reduced species are detected at the surface, while for samples irradiated with 4 keV ions the reduced species are found to be mostly localized in depth. The observed irradiation effects are explained in terms of bombardment-induced Gibbsian segregation (BIS) mechanism. (literal)
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