Transient photoresponse and incident power dependence of high-efficiency germanium quantum dot photodetectors (Articolo in rivista)

Type
Label
  • Transient photoresponse and incident power dependence of high-efficiency germanium quantum dot photodetectors (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1063/1.4759252 (literal)
Alternative label
  • Liu P., Cosentino S., Le S.T., Lee S., Paine D., Zaslavsky A., Pacifici D., Mirabella S., Miritello M., Crupi I., Terrasi A. (2012)
    Transient photoresponse and incident power dependence of high-efficiency germanium quantum dot photodetectors
    in Journal of applied physics
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Liu P., Cosentino S., Le S.T., Lee S., Paine D., Zaslavsky A., Pacifici D., Mirabella S., Miritello M., Crupi I., Terrasi A. (literal)
Pagina inizio
  • 083103 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 112 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 8 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • a Physics Department, Brown University, Providence, RI 02912, United States; b School of Engineering, Brown University, Providence, RI 02912, United States; c MATIS-IMM-CNR, Dipartimento di Fisica Ed Astronomia, Universita di Catania, Catania I-95123, Italy (literal)
Titolo
  • Transient photoresponse and incident power dependence of high-efficiency germanium quantum dot photodetectors (literal)
Abstract
  • We report a systematic study of time-resolved and power-dependent photoresponse in high-efficiency germanium quantum dot photodetectors (Ge-QD PDs), with internal quantum efficiencies greater than 100% over a broad wavelength, reverse bias, and incident power range. Turn-on and turn-off response times (tau(on) and tau(off)) are shown to depend on series resistance, bias, optical power, and thickness (W-QD) of the Ge-QD layer, with measured tau(off) values down to similar to 40 ns. Two different photoconduction regimes are observed at low and high reverse bias, with a transition around -3 V. A transient current overshoot phenomenon is also observed, which depends on bias and illumination power. (literal)
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