Rough silver films studied by surface enhanced Raman spectroscopy and low temperature scanning tunnelling microscopy (Articolo in rivista)

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Label
  • Rough silver films studied by surface enhanced Raman spectroscopy and low temperature scanning tunnelling microscopy (Articolo in rivista) (literal)
Anno
  • 1995-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/0079-6816(95)00053-4 (literal)
Alternative label
  • Douketis, C. a, Haslett, T.L. a, Wang, Z. a, Moskovits, M. a, Iannotta, S. b (1995)
    Rough silver films studied by surface enhanced Raman spectroscopy and low temperature scanning tunnelling microscopy
    in Progress in surface sScience (Print); Pergamon-Elsevier Press Science LDT, Oxford (Regno Unito)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Douketis, C. a, Haslett, T.L. a, Wang, Z. a, Moskovits, M. a, Iannotta, S. b (literal)
Pagina inizio
  • 187 (literal)
Pagina fine
  • 195 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
  • Conference: 15th Biennial Canadian Conference on Surface Science (Surface Canada 95) Location: UNIV WATERLOO, WATERLOO, CANADA Date: MAY 25-27, 1995 Sponsor(s): Canadian Soc Chem, Div Surface Sci; Canadian Assoc Physicists (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.sciencedirect.com/science/article/pii/0079681695000534 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 50 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 1-4 (literal)
Note
  • ISI Web of Science (WOS) (literal)
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • a Department of Chemistry, University of Toronto and Ontario Laser, Lightwave Research Centre, Toronto, Ont. M5S 1A1, Canada b Centro Studi CNR, F.S.A.I.I., Povo di Trento 38050, Italy (literal)
Titolo
  • Rough silver films studied by surface enhanced Raman spectroscopy and low temperature scanning tunnelling microscopy (literal)
Abstract
  • The surface topography of Ag films and surface enhanced Raman scattering (SERS) from benzene on Ag films have been simultaneously recorded. The Ag films were formed by vacuum deposition at temperatures ranging from 100 K to 500 K. Analysis of scanning tunnelling microscopy (STM) images shows that films formed below 250 K are fractal structures with Hausdorff-Besicovitch dimension 2.55 < D < 2.72, while for those formed above 250 K, D?2. The lower temperature, rough films exhibit strong surface enhanced Raman scattering but the higher temperature, smooth films do not. We consider the consequences of fractal character and the possible correlation between this and the SERS activity of these films. (literal)
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