Light transport through disordered layers of dense gallium arsenide submicron particles (Articolo in rivista)

Type
Label
  • Light transport through disordered layers of dense gallium arsenide submicron particles (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1103/PhysRevB.85.115401 (literal)
Alternative label
  • an der Beek T. [ 1 ] ; Barthelemy P. [ 2 ] ; Johnson P.M. [ 1 ] ; Wiersma D.S. [ 3,4 ] ; Lagendijk A. [ 1 ] (2012)
    Light transport through disordered layers of dense gallium arsenide submicron particles
    in Physical review. B, Condensed matter and materials physics
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • an der Beek T. [ 1 ] ; Barthelemy P. [ 2 ] ; Johnson P.M. [ 1 ] ; Wiersma D.S. [ 3,4 ] ; Lagendijk A. [ 1 ] (literal)
Pagina inizio
  • 115401 (literal)
Pagina fine
  • 115401 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 85 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 11 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 11 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • [ 1 ] FOM Inst Atom & Mol Phys AMOLF, NL-1098 XG Amste, Netherlands [ 2 ] Delft Univ Technol, Fac Sci Appl, NL-2628 CJ Delft, Netherlands [ 3 ] European Lab Nonlinear Spect LENS, Florence, Italy [ 4 ] CNR INO, Florence, Italy (literal)
Titolo
  • Light transport through disordered layers of dense gallium arsenide submicron particles (literal)
Abstract
  • We present a study of optical transport properties of powder layers with submicrometer, strongly scattering gallium arsenide (GaAs) particles. Uniform, thin samples with well controlled thicknesses were created through the use of varying grinding times, sedimentation fractionation, annealing, and a new sedimentation technique. These fabrication parameters were optimized to produce maximum scattering and minimum absorption. The physical properties were characterized using scanning electron microscopy (SEM) and x-ray diffraction. The optical transport mean-free path, absorption length, and the diffusion constant were determined for each sample using both continuous wave and time-resolved methods. The samples scatter strongly in the near infrared region. Total reflection and transmission measurements show that all of these samples have high absorption. X-ray diffraction results suggest that the source of this absorption is grinding induced strain and/or defects in the crystal structure. For all the different grinded GaAs powder samples that we investigated, the absorption length was less than ten micrometers. (literal)
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