Effect of extended defects in planar and pixelated CdZnTe detectors (Articolo in rivista)

Type
Label
  • Effect of extended defects in planar and pixelated CdZnTe detectors (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.nima.2010.12.012 (literal)
Alternative label
  • Camarda, G. S. 1, Andreini, K. W. 2, Bolotnikov, A. E. 1, Cui, Y. 1, Hossain, A. 1, Gul, R. 1, Kim, K. -H. 1, Marchini, L. 1,3, Xu, L. 1,4, Yang, G. 1, Tkaczyk, J. E. 2, James, R. B. 1 (2011)
    Effect of extended defects in planar and pixelated CdZnTe detectors
    in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT; ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, AMSTERDAM (Paesi Bassi)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Camarda, G. S. 1, Andreini, K. W. 2, Bolotnikov, A. E. 1, Cui, Y. 1, Hossain, A. 1, Gul, R. 1, Kim, K. -H. 1, Marchini, L. 1,3, Xu, L. 1,4, Yang, G. 1, Tkaczyk, J. E. 2, James, R. B. 1 (literal)
Pagina inizio
  • 170 (literal)
Pagina fine
  • 173 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
  • Symposium on Radiation Measurements and Applications (SORMA) XII 2010 ID_PUMA: cnr.imem/2011-A0-044 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.sciencedirect.com/science/article/pii/S016890021002749X (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 652 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 4 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 1 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • [ 1 ] Brookhaven Natl Lab, Upton, NY 11973 USA; [ 2 ] Gen Elect Global Res, Niskayuna, NY USA; [ 3 ] CNR, IMEM, I-43100 Parma, Italy; [ 4 ] NW Polytech Univ, Xian 710072, Shaanxi, Peoples R China (literal)
Titolo
  • Effect of extended defects in planar and pixelated CdZnTe detectors (literal)
Abstract
  • We evaluated a spectroscopy-grade 15 x 15 x 7 mm(3) CdZnTe (CZT) crystal with a high pi-product, > 10(-2) cm(2)/V, but impaired by microscopic extended defects, such as walls of dislocations, low-angle and sub-grain boundaries, and Te inclusions. First, we evaluated a planar detector fabricated from this crystal using a Micro-scale X-ray Detector Mapping (MXDM) technique. Then, we fabricated from the same crystal a pixel detector to study local non-uniformities of the electric field. The measured X-ray response maps confirmed the presence of non-uniformities in the charge transport, and they showed that the global- and local-distortions of the internal E-field correlated to the extended defects and space-charge buildup on the side surfaces. (literal)
Editore
Prodotto di
Autore CNR
Insieme di parole chiave

Incoming links:


Prodotto
Autore CNR di
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
Editore di
Insieme di parole chiave di
data.CNR.it