X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x=0-2) films on Si (111) (Articolo in rivista)

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  • X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x=0-2) films on Si (111) (Articolo in rivista) (literal)
Anno
  • 2013-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1063/1.4788982 (literal)
Alternative label
  • G. Niu, M. H. Zoellner, P. Zaumseil, A. Pouliopoulos, F. d'Acapito, T. Schroeder, F. Boscherini (2013)
    X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x=0-2) films on Si (111)
    in Journal of applied physics; American Institute of Physics, Melville [NY] (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • G. Niu, M. H. Zoellner, P. Zaumseil, A. Pouliopoulos, F. d'Acapito, T. Schroeder, F. Boscherini (literal)
Pagina inizio
  • 043504-1 (literal)
Pagina fine
  • 043504-6 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 113 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 6 (literal)
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  • 1IHP, Im Technologiepark 25, 15236 Frankfurt (Oder), Germany 2Department of Physics and Astronomy, University of Bologna, viale C. BertiPichat 6/2, 40127 Bologna, Italy 3Consiglio Nazionale delle Ricerche, Istituto Officina dei Materiali, Operative Group in Grenoble, c/o European Synchrotron Radiation Facility, B.P. 220, 38043 Grenoble, France 4BTU Cottbus, Konrad-Zuse-Str. 1, 03046 Cottbus, Germany (literal)
Titolo
  • X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x=0-2) films on Si (111) (literal)
Abstract
  • Ternary single crystalline bixbyite PrxY2-xO3 films over the full stoichiometry range (x = 0-2) have been epitaxially grown on Si (111) with tailored electronic and crystallographic structure. In this work, we present a detailed study of their local atomic environment by extended X-ray absorption fine structure at both Y K and Pr LIII edges, in combination with complementary high resolution x-ray diffraction measurements. The local structure exhibits systematic variations as a function of the film composition. The cation coordination in the second and third coordination shells changes with composition and is equal to the average concentration, implying that the PrxY2-xO3 films are indeed fully mixed and have a local bixbyite structure with random atomic-scale ordering. A clear deviation from the virtual crystal approximation for the cation-oxygen bond lengths is detected. This demonstrates that the observed Vegard's law for the lattice variation as a function of composition is based microscopically on a more complex scheme related to local structural distortions which accommodate the different cation-oxygen bond lengths. (literal)
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