http://www.cnr.it/ontology/cnr/individuo/prodotto/ID197543
New silicon SPAD technology for enhanced redsensitivity, high-resolution timing and system integration (Articolo in rivista)
- Type
- Label
- New silicon SPAD technology for enhanced redsensitivity, high-resolution timing and system integration (Articolo in rivista) (literal)
- Anno
- 2012-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1117/12.919120 (literal)
- Alternative label
A. Gulinatti, I. Rech a , F. Panzeri , C. Cammi, P. Maccagnani, M. Ghioni & S. Cova (2012)
New silicon SPAD technology for enhanced redsensitivity, high-resolution timing and system integration
in Journal of modern optics (Online); Taylor & Francis Group, London (Regno Unito)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- A. Gulinatti, I. Rech a , F. Panzeri , C. Cammi, P. Maccagnani, M. Ghioni & S. Cova (literal)
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://www.tandfonline.com/doi/abs/10.1080/09500340.2012.701340 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Dipartimento di Elettronica e Informazione, Politecnico di Milano, Milano, Italy
IMM-CNR sez. Bologna, Bologna, Italy
Micro Photon Devices (MPD), Bolzano, Italy (literal)
- Titolo
- New silicon SPAD technology for enhanced redsensitivity, high-resolution timing and system integration (literal)
- Abstract
- In this paper we present a new technology for the fabrication of Single Photon Avalanche Diodes (SPADs) aimed
at combining the advantages of thin and thick SPADs. The new detector is manufactured in a thick epitaxial
layer designed to improve the Photon Detection Efficiency (PDE) in the red and near-infrared range while
maintaining a good timing resolution. Experimental characterization of the new red-enhanced SPAD
(RE-SPAD) confirmed a significant improvement of the PDE compared with thin SPADs; for example the
PDE at a wavelength of 800nm has increased from 15% to about 40%. Nevertheless the temporal resolution is
still good, with a timing jitter of about 90 ps FWHM. In the same operating conditions the dark count rate is
comparable with the one attainable with a thin SPAD (e.g. less than 25 cps for a 50 mm diameter device cooled
down to ?5?C). Moreover, being planar, the new technology is compatible with the fabrication of arrays of
detectors. (literal)
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