Characterization of nanostructured copper films for electromagnetic shield (Articolo in rivista)

Type
Label
  • Characterization of nanostructured copper films for electromagnetic shield (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1108/03321641211227366 (literal)
Alternative label
  • Desideri D.; Maschio A.; Bolzan M.; Natali M.; Spolaore M. (2012)
    Characterization of nanostructured copper films for electromagnetic shield
    in Compel; Emerald, Bingley (Regno Unito)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Desideri D.; Maschio A.; Bolzan M.; Natali M.; Spolaore M. (literal)
Pagina inizio
  • 1122 (literal)
Pagina fine
  • 1132 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
  • Publisher: Emerald Group Publishing Limited (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://www.emeraldinsight.com/journals.htm?articleid=17046998 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 31 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 11 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 4 (literal)
Note
  • Scopu (literal)
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1 Department of Electrical Engineering, University of Padova, Padova, Italy; 2 Institute of Inorganic Chemistry and Surfaces, National Research Council, Padova, Italy; 3 Consorzio RFX, Euratom-ENEA Fusion Association, Padova, Italy. (Daniele Desideri 1, Alvise Maschio 1, Marco Bolzan 1, Marco Natali 2, Monica Spolaore 3) (literal)
Titolo
  • Characterization of nanostructured copper films for electromagnetic shield (literal)
Abstract
  • Purpose - The purpose of this paper is to obtain a multidisciplinary characterization of nanostructured copper films for electromagnetic shields. Design/methodology/approach - Structural and electrical analysis have been applied, on copper nanometric films produced by a magnetron sputtering device. Findings - Data are provided for copper films realized by magnetron sputtering deposition on glass, in different operating conditions. Practical implications - A multidisciplinary comprehension of shielding effectiveness of nanostructured thin films can be important in many applications where there are electromagnetic compatibility problems. Originality/value - The paper gives a valuable set of information for the characterization of nanometric copper thin films. (literal)
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