http://www.cnr.it/ontology/cnr/individuo/prodotto/ID195612
Characterization of nanostructured copper films for electromagnetic shield (Articolo in rivista)
- Type
- Label
- Characterization of nanostructured copper films for electromagnetic shield (Articolo in rivista) (literal)
- Anno
- 2012-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1108/03321641211227366 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Desideri D.; Maschio A.; Bolzan M.; Natali M.; Spolaore M. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni
- Publisher: Emerald Group Publishing Limited (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://www.emeraldinsight.com/journals.htm?articleid=17046998 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
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- Scopu (literal)
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- 1 Department of Electrical Engineering, University of Padova, Padova, Italy;
2 Institute of Inorganic Chemistry and Surfaces, National Research Council, Padova, Italy;
3 Consorzio RFX, Euratom-ENEA Fusion Association, Padova, Italy.
(Daniele Desideri 1, Alvise Maschio 1, Marco Bolzan 1, Marco Natali 2, Monica Spolaore 3) (literal)
- Titolo
- Characterization of nanostructured copper films for electromagnetic shield (literal)
- Abstract
- Purpose - The purpose of this paper is to obtain a multidisciplinary characterization of nanostructured copper films for electromagnetic shields. Design/methodology/approach - Structural and electrical analysis have been applied, on copper nanometric films produced by a magnetron sputtering device. Findings - Data are provided for copper films realized by magnetron sputtering deposition on glass, in different operating conditions. Practical implications - A multidisciplinary comprehension of shielding effectiveness of nanostructured thin films can be important in many applications where there are electromagnetic compatibility problems. Originality/value - The paper gives a valuable set of information for the characterization of nanometric copper thin films. (literal)
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