Raman spectroscopy of Bi-Te thin films (Articolo in rivista)

Type
Label
  • Raman spectroscopy of Bi-Te thin films (Articolo in rivista) (literal)
Anno
  • 2008-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1002/jrs.1874 (literal)
Alternative label
  • Russo V.; Bailini A.; Zamboni M.; Passoni M.; Conti C.; Casari C.S.; Li Bassi A.; Bottani C.E. (2008)
    Raman spectroscopy of Bi-Te thin films
    in Journal of Raman spectroscopy
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Russo V.; Bailini A.; Zamboni M.; Passoni M.; Conti C.; Casari C.S.; Li Bassi A.; Bottani C.E. (literal)
Pagina inizio
  • 205 (literal)
Pagina fine
  • 210 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 39 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 5 (literal)
Note
  • Google Scholar (literal)
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Russo V., Bailini A., Zamboni M., Passoni M., Casari C.S., Li Bassi A., Bottani C.E. NEMAS - Center for NanoEngineered MAterials and Surfaces and Dipartimento di Ingegneria Nucleare, Politecnico di Milano, Conti C. ICVBC-CNR - Istituto per la Conservazione e la Valorizzazione dei Beni Culturali (literal)
Titolo
  • Raman spectroscopy of Bi-Te thin films (literal)
Abstract
  • The deposition of micro- and nanocrystalline bismuth telluride thin films with tailored structure and composition is of interest in view of improving the well-known material thermoelectric properties. Only a few works exist that discuss Raman scattering of Bi2Te3 crystals and films, while a Raman characterization of other phases, i.e. other lesser known compounds of the Bi-Te system, such as tsumoite (BiTe) and pilsenite (Bi4Te3), is still completely lacking. We here present a Raman investigation of Bi-Te polycrystalline thin films with controlled structure (stoichiometry and growth orientation), morphology and phase composition, produced by nanosecond pulsed laser deposition. Interpretation of Raman spectra from Bi-Te films was supported by scanning electron microscopy, energy dispersive spectroscopy (EDS) and X-Ray diffraction measurements, together with the predictions of the group theory. In this way, the first Raman characterization of Bi-rich phases (namely BiTe and Bi4Te3) has been obtained. For Bi-Te compositions characterized by a high Bi or Te content, Raman spectra reveal that segregation of elemental Bi or Te occurs. (literal)
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