Frequency analysis of the dielectric constant of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates (Articolo in rivista)

Type

• Articolo in rivista (Classe)
• Prodotto della ricerca (Classe)

Label

• Frequency analysis of the dielectric constant of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates (Articolo in rivista) (literal)

Anno

• 2006-01-01T00:00:00+01:00 (literal)

Alternative label

• M. A. Navacerrada, M. L. Lucía, L. L. Sánchez-Soto, F. Sánchez-Quesada, E. Sarnelli, and C. Nappi (2006)
  Frequency analysis of the dielectric constant of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates
  in Physical review. B, Condensed matter and materials physics
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• M. A. Navacerrada, M. L. Lucía, L. L. Sánchez-Soto, F. Sánchez-Quesada, E. Sarnelli, and C. Nappi (literal)

Pagina inizio

• 024507 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 74 (literal)

Rivista

• Physical review. B, Condensed matter and materials physics (Rivista)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• 1Departamento de Física e Instalaciones, Escuela Técnica Superior de Arquitectura, Universidad Politécnica, Avda. Juan de Herrera 4, 28040 Madrid, Spain 2Departamento de Física Aplicada III (Electricidad y Electrónica), Facultad de CC. Físicas, Universidad Complutense, Avda. Complutense s/n, 28040 Madrid, Spain 3Departamento de Óptica, Facultad de Ciencias Físicas, Universidad Complutense, Avda. Complutense s/n, 28040 Madrid, Spain 4Istituto di Cibernetica \"E. Caianello\" CNR, Via Campi Flegrei, 34 Pozzuoli, Italy (literal)

Titolo

• Frequency analysis of the dielectric constant of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates (literal)

Abstract

• We have studied the electromagnetic parameters of YBa2Cu3O7 Josephson junctions fabricated on bicrystalline substrates with different angles tilted around the 100 and 001 axis. Changing a technological parameter such as the junction width permits change to the resonant frequency of the barrier cavity. This change in the resonance frequency allows one to determine a frequency dependent dispersion relation of the dielectric constant. We have explored the proximity to a resonance in the dielectric response and analyzed its resonance frequency and damping constant. In terms of a RLC circuital equivalence additional information on the inductive response is presented as a comparative study of junctions fabricated on substrates with different bicrystalline misorientations (literal)

Prodotto di

• Istituto di cibernetica \"Edoardo Caianiello\" (ISASI) (Istituto)
• Fisica e Tecnologia dei Sistemi Coerenti (MD.P04.010.001) (Modulo)

Autore CNR

• ETTORE SARNELLI (Persona)
• CIRO NAPPI (Persona)

Incoming links:

Prodotto

• Istituto di cibernetica \"Edoardo Caianiello\" (ISASI) (Istituto)
• Fisica e Tecnologia dei Sistemi Coerenti (MD.P04.010.001) (Modulo)

Autore CNR di

• CIRO NAPPI (Persona)
• ETTORE SARNELLI (Persona)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Physical review. B, Condensed matter and materials physics (Rivista)