µ-XRF analysis of glasses: a non-destructive utility for Cultural Heritage Applications. (Articolo in rivista)

Type
Label
  • µ-XRF analysis of glasses: a non-destructive utility for Cultural Heritage Applications. (Articolo in rivista) (literal)
Anno
  • 2012-01-01T00:00:00+01:00 (literal)
Alternative label
  • Vaggelli G.; Cossio R (2012)
    µ-XRF analysis of glasses: a non-destructive utility for Cultural Heritage Applications.
    in Analyst (Lond., 1877, Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Vaggelli G.; Cossio R (literal)
Pagina inizio
  • 662 (literal)
Pagina fine
  • 667 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 137 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 6 (literal)
Note
  • ISI Web of Science (WOS) (literal)
  • Scopus (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • CNR - Istituto di Geoscienze e Georisorse, Via Valperga Caluso, 35, I-10125 Torino. Dipartimento di Scienze Mineralogiche e Petrologiche, Via Valperga Caluso, 35, I-10125 Torino (literal)
Titolo
  • µ-XRF analysis of glasses: a non-destructive utility for Cultural Heritage Applications. (literal)
Abstract
  • This paper presents an analytical approach for a non destructive study of Cultural Heritage glass finds by µ-XRF technique which can be used for quantitative analysis of small volumes of solid samples, with a sensitivity that is superior to the electron microprobe, but inferior to an ICP-MS system. An experimental set-up with natural and synthetic glass standards is here proposed for the quantitative analyses from major to trace elements of not sampling or handling glasses by means of the commercial µ-XRF Eagle III-XPL. The described method was applied to the commercial Glass standards produced by the Society of Glass Technology and to Islamic glasses from Veh Ardasid (Central Iraq), dated III-V century A.D. and previously analyzed by ICP-MS and SEM-EDS technique.1,2 Major/minor (Na, Mg, Al, Si, S, K, Ca, Ti, Fe) and trace elements (from Cr to Zr) were first determined by both a fundamental parameter with standards method and with the intensity correction method proposed by Lucas-Thooth and Pyne. 3,4. The tested reference glass samples show a good accuracy better than 5% on major elements with both correction routines. Trace elements display better accuracy than 5% for trace elements > 100 ppm and better or comparable to 10% for trace elements < 100 ppm simply using a fundamental parameter with two standards correction routine, resulting more accurate than the algorithm of Lucas-Thooth and Pyne 3,4 using the same small number of standards. Therefore, it has to be emphasized that the ??-XRF is a well suited elemental analysis technique for the study of small not sampling glass finds due to its good accuracy, reproducibility and low detection limits (? tens ppm) despite it being a non destructive analytical technique. (literal)
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