http://www.cnr.it/ontology/cnr/individuo/prodotto/ID18567
MOCVD of Vanadium Oxide Films with a Novel Vanadium(III) Precursor (Articolo in rivista)
- Type
- Label
- MOCVD of Vanadium Oxide Films with a Novel Vanadium(III) Precursor (Articolo in rivista) (literal)
- Anno
- 2011-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1002/cvde.201004291 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Crociani L.; Carta G.; Natali M.; Rigato V.; Rossetto G. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
- http://onlinelibrary.wiley.com/doi/10.1002/cvde.201004291/full (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Note
- Scopu (literal)
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- 1,2,3,5 : CNR, Inst Chim Inorgan & Superfici, I-35127 Padua, Italy /
4: Ist Nazl Fis Nucl, LNL, I-35020 Legnaro, Italy (literal)
- Titolo
- MOCVD of Vanadium Oxide Films with a Novel Vanadium(III) Precursor (literal)
- Abstract
- In this communication we report the synthesis and characterization of the vanadium (III) alkoxide [V(OCMe(2)CH(2)OMe)(3)], which presents an appreciable volatility (55 degrees C/1.5 Torr), its successful use as MOCVD precursor for the deposition of pure VO(2) and V(2)O(5) films and the characterization of the films by means of Rutherford Backscattering Spectroscopy (RBS), X-Ray Diffraction (XRD) and Cyclic Voltammetry. (literal)
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- Autore CNR
- Insieme di parole chiave
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