http://www.cnr.it/ontology/cnr/individuo/prodotto/ID182296
Atomistic mechanism of boron diffusion in silicon (Articolo in rivista)
- Type
- Label
- Atomistic mechanism of boron diffusion in silicon (Articolo in rivista) (literal)
- Anno
- 2006-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1103/PhysRevLett.97.255902 (literal)
- Alternative label
Napolitani, Enrico (1); Impellizzeri, Giuliana (2); Mirabella, Salvatore (2); PRIOLO, FRANCESCO (2); DE SALVADOR, DAVIDE (1); BISOGNIN, GABRIELE (1); CARNERA, ALBERTO (1) (2006)
Atomistic mechanism of boron diffusion in silicon
in Physical review letters; American Physical Society (APS), College Pk (Stati Uniti d'America)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Napolitani, Enrico (1); Impellizzeri, Giuliana (2); Mirabella, Salvatore (2); PRIOLO, FRANCESCO (2); DE SALVADOR, DAVIDE (1); BISOGNIN, GABRIELE (1); CARNERA, ALBERTO (1) (literal)
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- (1) MATIS INFM-CNR - Padova University; (2) MATIS INFM-CNR - Catania University (literal)
- Titolo
- Atomistic mechanism of boron diffusion in silicon (literal)
- Abstract
- B diffuses in crystalline Si by reacting with a Si self-interstitial (I) with a frequency g and so forming a
fast migrating BI complex that can migrate for an average length ?. We experimentally demonstrate that
both g and ? strongly depend on the free hole concentration p. At low p, g has a constant trend and ?
increases with p, while at high p, g has a superlinear trend and ? decreases with p. This demonstrates that
BI forms in the two regimes by interaction with neutral and double positive I, respectively, and its charge
state has to change by interaction with free holes before diffusing. (literal)
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