http://www.cnr.it/ontology/cnr/individuo/prodotto/ID178903
Silicon carbide and its use as a radiation detector material (Articolo in rivista)
- Type
- Label
- Silicon carbide and its use as a radiation detector material (Articolo in rivista) (literal)
- Anno
- 2008-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1088/0957-0233/19/10/102001 (literal)
- Alternative label
Nava F.; Bertuccio G.; Cavallini A.; Vittone, E. (2008)
Silicon carbide and its use as a radiation detector material
in Measurement science & technology (Print); IOP Publishing Ltd. (Institute of Physics Publishing Ltd), "Bristol ; London" (Regno Unito)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Nava F.; Bertuccio G.; Cavallini A.; Vittone, E. (literal)
- Pagina inizio
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- Invited Topical Review (literal)
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- http://iopscience.iop.org/0957-0233/19/10/102001/ (literal)
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- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Physics Department, University of Modena, via G Campi 213/a, 41100 Modena, Italy;
National Institute of Nuclear Physics (INFN), Bologna, Italy;
Department of Electronics Engineering and Information Science and INFN Milano, Politecnico of Milano, P.za L da Vinci 32, 20133 Milano, Italy;
Physics Department, University of Bologna, and CNISM viale Berti Pichat 6/2, 40127 Bologna, Italy;
Experimental Physics Department/NIS Excellence Center, University of Torino, CNISM and INFN Torino, via P Giuria 1, 10125 Torino, Italy (literal)
- Titolo
- Silicon carbide and its use as a radiation detector material (literal)
- Abstract
- We present a comprehensive review of the properties of the epitaxial 4H silicon carbide
polytype (4H-SiC). Particular emphasis is placed on those aspects of this material related to
room, high-temperature and harsh environment ionizing radiation detector operation. A review
of the characterization methods and electrical contacting issues and how these are related to
detector performance is presented. The most recent data on charge transport parameters across
the Schottky barrier and how these are related to radiation spectrometer performance are
presented. Experimental results on pixel detectors having equivalent noise energies of
144 eV FWHM (7.8 electrons rms) and 196 eV FWHM at +27 oC and +100 oC, respectively,
are reported. Results of studying the radiation resistance of 4H-SiC are analysed. The data on
the ionization energies, capture cross section, deep-level centre concentrations and their
plausible structures formed in SiC as a result of irradiation with various particles are reviewed.
The emphasis is placed on the study of the 1 MeV neutron irradiation, since these thermal
particles seem to play the main role in the detector degradation. An accurate electrical
characterization of the induced deep-level centres by means of PICTS technique has allowed
one to identify which play the main role in the detector degradation. (literal)
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