Sum rules for resonant inelastic x-ray scattering: Explicit form and angular dependence in perpendicular geometry (Articolo in rivista)

Type
Label
  • Sum rules for resonant inelastic x-ray scattering: Explicit form and angular dependence in perpendicular geometry (Articolo in rivista) (literal)
Anno
  • 2004-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1103/PhysRevB.69.134420 (literal)
Alternative label
  • Francesco Borgatti; Giacomo Ghiringhelli; Paolo Ferriani; Giulio Ferrari; Gerritt van der Laan; Carlo Maria Bertoni (2004)
    Sum rules for resonant inelastic x-ray scattering: Explicit form and angular dependence in perpendicular geometry
    in Physical review. B, Condensed matter and materials physics; American Physical Society (APS), College Pk (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Francesco Borgatti; Giacomo Ghiringhelli; Paolo Ferriani; Giulio Ferrari; Gerritt van der Laan; Carlo Maria Bertoni (literal)
Pagina inizio
  • 134420-1 (literal)
Pagina fine
  • 134420-8 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://link.aps.org/doi/10.1103/PhysRevB.69.134420 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 69 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 8 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 13 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • INFM-TASC, Basovizza, S.S. 14, km 163,5, 34012 Trieste, Italy; INFM-Dipartmento di Fisica, Politecnico di Milano, p. Leonardo da Vinci 32, 20133 Milano, Italy; INFM-Dipartmento di Fisica, Universita` di Modena e Reggio Emilia, via Campi, Modena, Italy; INFM-Dipartmento di Fisica, Universita` di Modena e Reggio Emilia, via Campi, Modena, Italy; Magnetic Spectroscopy, Daresbury Laboratory, Warrington WA4 4AD, United Kingdom; INFM-Dipartmento di Fisica, Universita` di Modena e Reggio Emilia, via Campi, Modena, Italy (literal)
Titolo
  • Sum rules for resonant inelastic x-ray scattering: Explicit form and angular dependence in perpendicular geometry (literal)
Abstract
  • Resonant inelastic x-ray scattering (RIXS) and resonant photoemission spectroscopy (RPES) can be used to selectively measure the ground-state properties of atoms in solid materials. For the two types of experiment we compare the sum rules developed in the past years to extract quantitative information from the measured spectra. We show that if the measurements are not sensitive to the emitted photon polarization state (in RIXS) or to the photoelectron spin orientation (in RPES), the two experiments exhibit the same angular dependence of the spectral intensities but differ in some numerical coefficients in the sum rules. In particular we give explicit expressions for the RIXS sum rules in the so-called perpendicular geometry for all the cases of practical interest. These rules can serve, in combination with the well-known x-ray magnetic circular dichroism sum rules in absorption, to evaluate the quadrupole and octupole moments of the scattering atoms. (literal)
Editore
Autore CNR
Insieme di parole chiave

Incoming links:


Autore CNR di
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
Editore di
Insieme di parole chiave di
data.CNR.it