Atomic force microscopy and X-ray photoelectron spectroscopy characterization of low-energy ion sputtered mica (Articolo in rivista)

Type

• Prodotto della ricerca (Classe)
• Articolo in rivista (Classe)

Label

• Atomic force microscopy and X-ray photoelectron spectroscopy characterization of low-energy ion sputtered mica (Articolo in rivista) (literal)

Anno

• 2007-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1016/j.susc.2006.12.056 (literal)

Alternative label

• Renato Buzio; Andrea Toma; Andrea Chincarini; Francesco Buatier de Mongeot; Corrado Boragno; Ugo Valbusa (2007)
  Atomic force microscopy and X-ray photoelectron spectroscopy characterization of low-energy ion sputtered mica
  in Surface science; ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, AMSTERDAM (Paesi Bassi)
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Renato Buzio; Andrea Toma; Andrea Chincarini; Francesco Buatier de Mongeot; Corrado Boragno; Ugo Valbusa (literal)

Pagina inizio

• 2735 (literal)

Pagina fine

• 2739 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni

• International Conference on NANO-Structures Self Assembling Location: Aix en Provence, FRANCE Date: JUL 02-06, 2006 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url

• http://www.sciencedirect.com/science/article/pii/S0039602806013276 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 601 (literal)

Rivista

• Surface science (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 5 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• CNR - INFM Unità di Genova, Dipartimento di Fisica, Via Dodecaneso 33, 16146 Genova, Italy; Dipartimento di Fisica, Università degli Studi di Genova, Via Dodecaneso 33, 16146 Genova, Italy; INFN - Unità di Genova, Dipartimento di Fisica, Via Dodecaneso 33, 16146 Genova, Italy; (literal)

Titolo

• Atomic force microscopy and X-ray photoelectron spectroscopy characterization of low-energy ion sputtered mica (literal)

Abstract

• We report for the first time on muscovite mica surfaces nanostructured by a low-energy defocused Ar ion beam: ripple structures self- organize on macroscopic areas, with wavelength and roughness in the range 40-140 nm and 0.5-15 nm respectively, according to ions dose. In detail we address structural and chemical variations of the surface layer induced by sputtering. X-ray Photoelectron Spectros- copy (XPS) survey spectra reveal selective sputtering and Al surface enrichment whereas Atomic Force Microscopy (AFM) force-spec- troscopy experiments indicate reduced charging of irradiated specimens under aqueous electrolyte solutions. Such experimental evidences contribute to clarify the chemical and physical properties of nanostructured mica samples, in view of their potential use as templates for aligned deposition of organic molecules and investigations on nanolubrication phenomena. (literal)

Editore

• ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS (Editore)

Autore CNR

• RENATO BUZIO (Unità di personale interno)
• UGO VALBUSA (Persona)
• FRANCESCO BUATIER DE MONGEOT (Persona)

Insieme di parole chiave

• Parole chiave di "Atomic force microscopy and X-ray photoelectron spectroscopy characterization of low-energy ion sputtered mica" (Insieme di parole chiave)

Incoming links:

Autore CNR di

• UGO VALBUSA (Persona)
• RENATO BUZIO (Unità di personale interno)
• FRANCESCO BUATIER DE MONGEOT (Persona)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• Surface science (Rivista)

Editore di

• ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS (Editore)

Insieme di parole chiave di

• Parole chiave di "Atomic force microscopy and X-ray photoelectron spectroscopy characterization of low-energy ion sputtered mica" (Insieme di parole chiave)