http://www.cnr.it/ontology/cnr/individuo/prodotto/ID170913

Evolution of the Pt layer deposited on MgO(001) by PLD as a function of the deposition parameters: a Scanning Tunneling Microscopy and Energy Dispersive X-ray Diffractometry/Reflectometry study (Articolo in rivista)

Type

Prodotto della ricerca (Classe)
Articolo in rivista (Classe)

Label

Evolution of the Pt layer deposited on MgO(001) by PLD as a function of the deposition parameters: a Scanning Tunneling Microscopy and Energy Dispersive X-ray Diffractometry/Reflectometry study (Articolo in rivista) (literal)

Anno

2006-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

10.1021/jp0554644 (literal)

Alternative label

Scavia G.; Agostinelli E.; Laureti S.; Varvaro G.; Paci B.; Generosi A.; Rossi Albertini V.; Kaciulis S.; Mezzi A. (2006)
Evolution of the Pt layer deposited on MgO(001) by PLD as a function of the deposition parameters: a Scanning Tunneling Microscopy and Energy Dispersive X-ray Diffractometry/Reflectometry study
in The journal of physical chemistry. B
(literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

Scavia G.; Agostinelli E.; Laureti S.; Varvaro G.; Paci B.; Generosi A.; Rossi Albertini V.; Kaciulis S.; Mezzi A. (literal)

Pagina inizio

5529 (literal)

Pagina fine

5536 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url

http://www.scopus.com/record/display.url?eid=2-s2.0-33645656732&origin=resultslist&sort=plf-f&src=s&st1=Scavia+G*&sid=JALd3JxLSZZH2NhOgd-Im4q%3a30&sot=b&sdt=b&sl=41&s=AUTHOR-NAME%28Scavia+G*%29+AND+PUBYEAR+%3d+2006&relpos=2&relpos=2&searchTerm=AUTHOR-NAME(Scavia%20G*)%20AND%20PUBYEAR%20=%202006 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

110 (literal)

Rivista

?The ?journal of physical chemistry. B (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note

http://dx.doi.org/10.1021/jp0554644 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo

11 (literal)

Note

ISI Web of Science (WOS) (literal)
Scopu (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

Area di Ricerca ROMA 1, Istituto di Struttura della Materia, CNR, via Salaria km 29.500, 00016 Monterotondo Scalo, Roma, Italy, Area di Ricerca di Tor Vergata, Istituto di Struttura della Materia, CNR, Via del Fosso del Cavaliere 100, 00133 Roma, Italy, and Area di Ricerca ROMA 1, Istituto per lo Studio di Materiali Nanostrutturati, CNR, via Salaria km 29.500, 00016 Monterotondo Scalo, Roma, Italy (literal)

Titolo

Evolution of the Pt layer deposited on MgO(001) by PLD as a function of the deposition parameters: a Scanning Tunneling Microscopy and Energy Dispersive X-ray Diffractometry/Reflectometry study (literal)

Abstract

A combined ultrahigh vacuum scanning tunneling microscopy (STM-UHV) and energy dispersive X-ray diffractometry/reflectometry (EDXD/EDXR) study of the evolution of face-centered cubic (fcc) Pt layer growth on MgO(100) by pulsed laser deposition as a function of the process parameters such as deposition temperature and deposition duration has been carried out. The aim of this study is to define the best experimental conditions to obtain a controlled film deposition selective on the Pt growth direction (either [111] or [002]). The evolution of the Pt surface morphology as a function of the deposition temperature (Tdep) from 300 to 700 °C has been studied with STM and ED techniques. Results show that the Pt surface, characterized at Tdep = 300 °C by a 3D island morphology, evolves at higher temperatures to a morphology in which the original islands coexist with a distribution of orthogonal 2D stripes. The two features can be associated with the [111] and [002] Pt growth directions of the fcc phase, respectively. For Tdep = 700 °C, the island morphology of the (111) face completely disappears, while the merging process of the (002) stripes reaches completion. The evolution of the morphology at Tdep = 600 °C as a function of the deposition time and thickness has then been studied with STM-UHV, revealing an initial growth of mosaic-like 3D islands. These independent islands, already interconnected, expand along two orthogonal directions and, for longer deposition times, lead to the texture of orthogonal stripes. The EDXR characterization providing the morphological parameters of the films, i.e., thickness and roughness, confirms the above observation and quantifies the effect of such morphological changes on the surface roughness of the Pt film, an important parameter for applications of Pt films as underlayer in magnetic recording media. (literal)

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