Electrochemistry layer by layer growth and characterization of copper sulur thin films on Ag(111) (Articolo in rivista)

Type
Label
  • Electrochemistry layer by layer growth and characterization of copper sulur thin films on Ag(111) (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.electacta.2011.10.004 (literal)
Alternative label
  • Innocenti M., Bencistà I., Bellandi S., Bianchini C., Di Benedetto F., Lavacchi A., F. Vizza , Foresti M.L. (2011)
    Electrochemistry layer by layer growth and characterization of copper sulur thin films on Ag(111)
    in Electrochimica acta
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Innocenti M., Bencistà I., Bellandi S., Bianchini C., Di Benedetto F., Lavacchi A., F. Vizza , Foresti M.L. (literal)
Pagina inizio
  • 599 (literal)
Pagina fine
  • 605 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 58 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
  • doi:10.1016/j.electacta.2011.10.04 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Istituto di Chimica dei Composti Organometallici (ICCOM-CNR), via Madonna del Piano 10, 50019 Sesto Fiorentino (FI), Italy; Department of Chemistry, University of Florence, via della Lastruccia 3, 50019 Sesto Fiorentino (FI), Italy (literal)
Titolo
  • Electrochemistry layer by layer growth and characterization of copper sulur thin films on Ag(111) (literal)
Abstract
  • Copper sulfide (CuS) thin films were grown on a single crystal Ag(1 1 1) substrate by Electrochemical Atomic Layer Deposition (ECALD) method, i.e., by alternated surface limited deposition of copper and sulfur. A detailed investigation of deposition of Cu on S allowed to find the best conditions for copper deposition. The electrochemical characterization of deposits obtained with different deposition cycles suggests a 1:1 stoichiometric ratio between Cu and S corresponding to Cu monosulfide. The compositional analysis was performed by X-rays Photoelectron Spectroscopy (XPS), and the morphological was investigated by Atomic Force Microscopy (AFM) for deposits formed with 20 ECALD cycles. (literal)
Prodotto di
Autore CNR

Incoming links:


Prodotto
Autore CNR di
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
data.CNR.it