http://www.cnr.it/ontology/cnr/individuo/prodotto/ID17058
Electrochemistry layer by layer growth and characterization of copper sulur thin films on Ag(111) (Articolo in rivista)
- Type
- Label
- Electrochemistry layer by layer growth and characterization of copper sulur thin films on Ag(111) (Articolo in rivista) (literal)
- Anno
- 2011-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.electacta.2011.10.004 (literal)
- Alternative label
Innocenti M., Bencistà I., Bellandi S., Bianchini C., Di Benedetto F., Lavacchi A., F. Vizza , Foresti M.L. (2011)
Electrochemistry layer by layer growth and characterization of copper sulur thin films on Ag(111)
in Electrochimica acta
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Innocenti M., Bencistà I., Bellandi S., Bianchini C., Di Benedetto F., Lavacchi A., F. Vizza , Foresti M.L. (literal)
- Pagina inizio
- Pagina fine
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
- doi:10.1016/j.electacta.2011.10.04 (literal)
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Istituto di Chimica dei Composti Organometallici (ICCOM-CNR), via Madonna del Piano 10, 50019 Sesto Fiorentino (FI), Italy;
Department of Chemistry, University of Florence, via della Lastruccia 3, 50019 Sesto Fiorentino (FI), Italy (literal)
- Titolo
- Electrochemistry layer by layer growth and characterization of copper sulur thin films on Ag(111) (literal)
- Abstract
- Copper sulfide (CuS) thin films were grown on a single crystal Ag(1 1 1) substrate by Electrochemical Atomic Layer Deposition (ECALD) method, i.e., by alternated surface limited deposition of copper and sulfur. A detailed investigation of deposition of Cu on S allowed to find the best conditions for copper deposition. The electrochemical characterization of deposits obtained with different deposition cycles suggests a 1:1 stoichiometric ratio between Cu and S corresponding to Cu monosulfide. The compositional analysis was performed by X-rays Photoelectron Spectroscopy (XPS), and the morphological was investigated by Atomic Force Microscopy (AFM) for deposits formed with 20 ECALD cycles. (literal)
- Prodotto di
- Autore CNR
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