Er3+ ion dispersion in tellurium oxychloride glasses (Articolo in rivista)

Type
Label
  • Er3+ ion dispersion in tellurium oxychloride glasses (Articolo in rivista) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.optmat.2005.10.008 (literal)
Alternative label
  • L. M. Fortes, L. F. Santos, M. C. Gonçalves, R. M. Almeida, M. Mattarelli, M. Montagna, A. Chiasera, M. Ferrari, A. Monteil, S. Chaussedent, G.C. Righin (2007)
    Er3+ ion dispersion in tellurium oxychloride glasses
    in Optical materials (Amst., Print)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • L. M. Fortes, L. F. Santos, M. C. Gonçalves, R. M. Almeida, M. Mattarelli, M. Montagna, A. Chiasera, M. Ferrari, A. Monteil, S. Chaussedent, G.C. Righin (literal)
Pagina inizio
  • 503 (literal)
Pagina fine
  • 509 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 29 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
  • Scopu (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • A. Chiasera, M. Ferrari - CSMFO Group, CNR-IFN, Institute of Photonics and Nanotechnologies, Via Sommarive 14, 38050 Trento, Italy L.M. Fortes, L.F. Santos, M.C. Gonalves, R.M. Almeida - Depart. Eng. de Materiais/ICEMS, Instituto Superior Técnico, Av. Rovisco Pais, 1049-001 Lisboa, Portugal M. Mattarelli, M. Montagna, , A. Monteil, S. Chaussedent - CSMFO Group, Dipartimento di Fisica, Università di Trento, Via Sommarive 14, I-38050 Trento, Italy G.C. Righini - Department of Optoelectronics and Photonics, Nello Carrara Institute of Applied Physics, IFAC-CNR, Via Panciatichi 64, I-50127 Firenze, Italy (literal)
Titolo
  • Er3+ ion dispersion in tellurium oxychloride glasses (literal)
Abstract
  • Erbium-doped tellurite glasses in the 60TeO2–20ZnO–20ZnCl2–xErCl3 systems, with erbium concentration between x = 1 and 10 mol%, were prepared and their refractive index and density were measured. Er3+ photoluminescence at 1.5 ¼m and the corresponding lifetime measurements were performed. A full width at half maximum value of about 53 nm for all the samples and lifetimes ranging between 4.2 and of 2.2 ms were obtained from the comparison of the radiative lifetimes calculated by Judd–Ofelt analysis and the measured lifetimes, quantum efficiency higher than 50% was assessed even in the most doped samples. A quenching concentration for the 1.5 ¼m emission of about 10% was estimated. (literal)
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