Planar antiresonant reflecting optical waveguides as integrated optical refractometer (Articolo in rivista)

Type
Label
  • Planar antiresonant reflecting optical waveguides as integrated optical refractometer (Articolo in rivista) (literal)
Anno
  • 2003-01-01T00:00:00+01:00 (literal)
Alternative label
  • Bernini R, Campopiano S, de Boer C, Sarro PM, Zeni L (2003)
    Planar antiresonant reflecting optical waveguides as integrated optical refractometer
    in IEEE sensors journal
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Bernini R, Campopiano S, de Boer C, Sarro PM, Zeni L (literal)
Pagina inizio
  • 652 (literal)
Pagina fine
  • 657 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 3 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • Bernini R: IREA-CNR Campopiano S, Sarro PM, Zeni L: Seconda Univ Napoli, Dipartimento Ingn Informazione, Aversa, Italy de Boer C: Delft Univ Technol, ECTM, Delft Inst Microelect & Submicron Technol, Delft, Netherlands (literal)
Titolo
  • Planar antiresonant reflecting optical waveguides as integrated optical refractometer (literal)
Abstract
  • This paper reports on an integrated refractometer sensor, useful for measuring chemical quantities, based on antiresonant reflecting optical waveguides (ARROWs). We show that, by a suitable design, the attenuation in ARROW waveguides can strongly depend on the refractive index of the superstrate layer. We use this property to design and,realize an integrated refractometer. The proposed sensor structure is unique in that it consists in the ARROW waveguide itself acting like a vertical interferometer. The device is fabricated using standard silicon technology, fully compatible with bipolar and CMOS integrated circuit process. The measurement results show a sensing resolution of Deltan = 6e - 4 when used in a solution with a refractive index of 1.4600. (literal)
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