http://www.cnr.it/ontology/cnr/individuo/prodotto/ID168439
Model independent pre-processing of X-ray powder diffraction profiles (Articolo in rivista)
- Type
- Label
- Model independent pre-processing of X-ray powder diffraction profiles (Articolo in rivista) (literal)
- Anno
- 2007-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1016/j.dsp.2006.02.001 (literal)
- Alternative label
Ladisa M. 1, Lamura A. 2, Laudadio T. 3, Nico G. 2 (2007)
Model independent pre-processing of X-ray powder diffraction profiles
in Digital signal processing (Print)
(literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Ladisa M. 1, Lamura A. 2, Laudadio T. 3, Nico G. 2 (literal)
- Pagina inizio
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- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- 1 Istituto di Cristallografia (IC-CNR), Via Amendola 122/O, 70126 Bari, Italy 2 Istituto Applicazioni Calcolo (IAC-CNR), Sezione di Bari, Via Amendola 122/D, 70126 Bari, Italy 3 Katholieke Universiteit Leuven, Department of Electrical Engineering, Division ESAT-SCD (SISTA), Kasteelpark Arenberg 10, 3001 Leuven-Heverlee, Belgium (literal)
- Titolo
- Model independent pre-processing of X-ray powder diffraction profiles (literal)
- Abstract
- Precise knowledge of X-ray diffraction profile shape is crucial in the investigation of the properties of matter in crystals powder.
Line-broadening analysis is the fourth pre-processing step in most of the full powder pattern fitting softwares. The final result of
line-broadening analysis strongly depends on three further steps: noise filtering, removal of background signal, and peak fitting.
In this work a new model independent procedure for two of the aforementioned steps (background suppression and peak fitting)
is presented. The former is dealt with by using morphological mathematics, while the latter relies on the HankelLanczos singular
value decomposition technique. Real X-ray powder diffraction (XRPD) intensity profiles of Ceria samples are used to test the
performance of the proposed procedure. Results show the robustness of this approach and its capability of efficiently improving
the disentangling of instrumental broadening. These features make the proposed approach an interesting and user-friendly tool for
the pre-processing of XRPD data. (literal)
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