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Structural study of CH3S self-assembled monolayers on Au(111) (Articolo in rivista)
- Type
- Label
- Structural study of CH3S self-assembled monolayers on Au(111) (Articolo in rivista) (literal)
- Anno
- 2008-01-01T00:00:00+01:00 (literal)
- Alternative label
Bracco, G; Cavanna, D; Thea, S; De Renzi, V (2008)
Structural study of CH3S self-assembled monolayers on Au(111)
in Vacuum
(literal)
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- Bracco, G; Cavanna, D; Thea, S; De Renzi, V (literal)
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- In: Vacuum, vol. 82 pp. 1421 - 1424. Selected papers presented at RIVA V-5th Iberian Vacuum Meeting - RIVA-5. Edited by Vasco Teixeira, Augusto M.C. Moutinho and José L. de Segovia. Elsevier, 2008. (literal)
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- \"[Bracco, Gianangelo; Cavanna, Davide] Univ Genoa, Dipartimento Fis, CNR, INFM, I-16146 Genoa, Italy; [Bracco, Gianangelo; Cavanna, Davide] Univ Genoa, Dipartimento Fis, CNR, IMEM, I-16146 Genoa, Italy; [Thea, Sergio] Univ Genoa, Dipartimento Chim & Chim Ind, I-16146 Genoa, Italy; [De Renzi, Valentina] Univ Modena, Dipartimento Fis, I-41100 Modena, Italy; [De Renzi, Valentina] INFM, Natl Res Ctr NanoStruct & BioSyst Surfaces S3, I-41100 Modena, Italy (literal)
- Titolo
- Structural study of CH3S self-assembled monolayers on Au(111) (literal)
- Abstract
- We present preliminary results of an experimental investigation of ordered phases of CH3S chemisorbed on Au(111). The self-assembled monolayer has been grown by dosing dimethyl disulfide in ultrahigh vacuum at different substrate temperatures between 200 K and 320 K and following different protocols. The monolayers have been characterized by means of low-energy He atom scattering with time-of-flight detection in a temperature range between 150 K and 300 K. The observed diffraction patterns show that the main periodicity is well-described by the (3 x 4) overlayer of the Au(111) lattice, coexisting with the (root 3 x root 3) periodicity, in agreement with previous results obtained by means of low-energy electron diffraction. (c) 2008 Elsevier Ltd. All rights reserved. (literal)
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