Imaging and phase measurements of 3D objects at 10.6 microns by digital holography (Articolo in rivista)

Type
Label
  • Imaging and phase measurements of 3D objects at 10.6 microns by digital holography (Articolo in rivista) (literal)
Anno
  • 2007-01-01T00:00:00+01:00 (literal)
Alternative label
  • Ferraro P., Grilli S., Miccio L., Buah Bassuah PK., Meucci R., De Nicola S., Arecchi F.T (2007)
    Imaging and phase measurements of 3D objects at 10.6 microns by digital holography
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Ferraro P., Grilli S., Miccio L., Buah Bassuah PK., Meucci R., De Nicola S., Arecchi F.T (literal)
Pagina inizio
  • 673612 (literal)
Pagina fine
  • 12-6 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 6736 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • CNR - Istituto Nazionale di Ottica Applicata, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy; CNR - Istituto Nazionale di Ottica Applicata, Largo E. Fermi 6, 50125 Firenze, Italy; Physics Dept, University of Cape Coast, Cape Coast, Ghana; Istituto di Cibernetica del CNR “E. Caianiello”, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy; Physics Dept , University of Firenze, Firenze, Italy (literal)
Titolo
  • Imaging and phase measurements of 3D objects at 10.6 microns by digital holography (literal)
Abstract
  • Digital holography in the mid infrared range is shown to be a feasible technique for optical metrological applications. The technique allows to reconstruct both amplitude and phase of wavefronts scattered by a 3D object. Experimental results of the method applied to the reconstruction of digitally holograms recorded at CO2 laser wavelength of 10.6 micron are reported. It is show that good reconstructions can be obtained even with the lower spatial resolution of IR recording detectors compared to visible CCD array. The results show that new prospective can be exploited by using high power CO2 laser sources in optical metrological applications. (literal)
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