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Second harmonic generation analysis in hydrogenated amorphous silicon nitride thin films (Articolo in rivista)
- Type
- Label
- Second harmonic generation analysis in hydrogenated amorphous silicon nitride thin films (Articolo in rivista) (literal)
- Anno
- 2007-01-01T00:00:00+01:00 (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
- 10.1063/1.2424661 (literal)
- Alternative label
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
- Lettieri S.; Merola F.; Maddalena P.; Ricciardi C.; Giorgis F. (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
- Rivista
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
- Note
- ISI Web of Science (WOS) (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
- Univ Naples Federico II, Dipartimento Sci Fis, CNR, INFM, I-80126 Naples, Italy; Politecn Turin, Dipartimento Fis, Lab Mat & Microsist, I-10129 Turin, Italy (literal)
- Titolo
- Second harmonic generation analysis in hydrogenated amorphous silicon nitride thin films (literal)
- Abstract
- Surface and interface electronic properties of plasma-deposited hydrogenated amorphous silicon nitride films have been investigated by means of optical second harmonic generation (SHG) technique. Polarization analysis shows that the nonlinear field origins from isotropic interfaces (film/substrate interface and film/air interface) whose spectral features are ascribed to surface/interface Si dangling bonds and strained Si-Si bonds. Differences and similarities with SHG spectra of pure amorphous silicon (a-Si:H) are discussed in terms of compositional inhomogeneities of the ternary alloy. (literal)
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