Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure (Brevetto)

Type

• Brevetto (Classe)
• Brevetto (Classe)
• Prodotto della ricerca (Classe)

Label

• Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure (Brevetto) (literal)

Anno

• 2006-01-01T00:00:00+01:00 (literal)

Alternative label

• Coppola G, Ferraro P, Iodice M, de Nicola S (2006)
  Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure
  
  (literal)

Titolo

• Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Coppola G, Ferraro P, Iodice M, de Nicola S (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#altreInformazioni

• Si tratta di un sistema interferometrico per la misura simulatanea dell'indice di rifrazione e dello spessore di materiali trasparenti con una singola operazione. (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#proprieta

• CNR (literal)

Http://www.cnr.it/ontology/cnr/brevetti.owl#tipoDiBrevetto

• Internazionale (literal)

Numero brevetto

• US 7,046,373 B2 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#descrizioneSinteticaDelProdotto

• Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials with a single measurement operation. The system employs an interferometer as a “shear interferometer” with the advantage of varying the wavelength of the luminous source. The index of refraction and the thickness are determined in two phases. Firstly it is determined the optical path analyzing the displacement of interferometric signal obtained by orthogonal incidence; successively, by means of phase recovery techniques and the previously determined optical path value, it is possible to obtain the index of refraction of the material. From the knowledge of the index and of the optical path it is obtained the material thickness. (literal)

Anno di deposito

• 2006 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• IMM-CNR Sezione di Napoli (literal)

Titolo

• Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure (literal)

Abstract

• Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials with a single measurement operation. The system employs an interferometer as a \"shear interferometer\" with the advantage of varying the wavelength of the luminous source. The index of refraction and the thickness are determined in two phases. Firstly it is determined the optical path analyzing the displacement of interferometric signal obtained by orthogonal incidence; successively, by means of phase recovery techniques and the previously determined optical path value, it is possible to obtain the index of refraction of the material. From the knowledge of the index and of the optical path it is obtained the material thickness. (literal)

Prodotto di

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Microsensori e sistemi di sensing ottici (MD.P05.014.002) (Modulo)

Autore CNR

• GIUSEPPE COPPOLA (Persona)
• MARIO IODICE (Unità di personale interno)

Insieme di parole chiave

• Parole chiave di "Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure" (Insieme di parole chiave)

Incoming links:

Prodotto

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Microsensori e sistemi di sensing ottici (MD.P05.014.002) (Modulo)

Autore CNR di

• MARIO IODICE (Unità di personale interno)
• GIUSEPPE COPPOLA (Persona)

Insieme di parole chiave di

• Parole chiave di "Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure" (Insieme di parole chiave)