CdO thin films: a study of their electronic structure by electron spin resonance spectroscopy (Articolo in rivista)

Type
Label
  • CdO thin films: a study of their electronic structure by electron spin resonance spectroscopy (Articolo in rivista) (literal)
Anno
  • 2005-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1016/j.apsusc.2004.10.026 (literal)
Alternative label
  • Antonino Gulino; Giovanni Tabbì (2005)
    CdO thin films: a study of their electronic structure by electron spin resonance spectroscopy
    in Applied surface science
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Antonino Gulino; Giovanni Tabbì (literal)
Pagina inizio
  • 322 (literal)
Pagina fine
  • 327 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 245 (literal)
Rivista
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • A. Gulino: Dipartimento di Scienze Chimiche, Università di Catania, INSTM UdR of Catania, V.le A. Doria 6, 95125 Catania, Italy (literal)
Titolo
  • CdO thin films: a study of their electronic structure by electron spin resonance spectroscopy (literal)
Abstract
  • The Cd(C5F6HO2)2 polyether adducts were used in MOCVD experiments of cadmium oxide, on optical transparent SiO2 substrates. Very mild heating (44-74 8C) resulted in, thermal stable, liquid compounds that can be easily evaporated. XRD measurements provided evidence of cubic highly textured CdO(1 0 0) films. The surface atomic composition was investigated by XPS analysis. UV-vis spectra showed that the transmittance of as-deposited films in the visible region is about 90%. Resistivity measurements of CdO thin films showed that they are highly conducting. ESR analysis suggests the presence of Cd+ ions, on the site of Cd2+, arising from polaronic self-trapping of electrons introduced by oxygen deficiency at Cd2+ sites to generate localised 5s1 states. (literal)
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