Chemical composition, microstructure and morphology as responsible for the electrical sensitivity of nanostructured SnO2-based thin films to CO gas (Abstract/Poster in atti di convegno)

Type
Label
  • Chemical composition, microstructure and morphology as responsible for the electrical sensitivity of nanostructured SnO2-based thin films to CO gas (Abstract/Poster in atti di convegno) (literal)
Anno
  • 2003-01-01T00:00:00+01:00 (literal)
Alternative label
  • Canevali C., Mari C.M., Mattoni M., Ruffo R., Scotti R., Morazzoni F., Armelao L., Barreca D., Tondello E., Bontempi E., Depero L.E. (2003)
    Chemical composition, microstructure and morphology as responsible for the electrical sensitivity of nanostructured SnO2-based thin films to CO gas
    in European Materials Research Society Meeting 2003, Strasbourg, France
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Canevali C., Mari C.M., Mattoni M., Ruffo R., Scotti R., Morazzoni F., Armelao L., Barreca D., Tondello E., Bontempi E., Depero L.E. (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
  • 10-13 giugno 2003 (literal)
Titolo
  • Chemical composition, microstructure and morphology as responsible for the electrical sensitivity of nanostructured SnO2-based thin films to CO gas (literal)
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Autore CNR

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