http://www.cnr.it/ontology/cnr/individuo/prodotto/ID1216

Chemical mapping of individual semiconductor nanostructures (Articolo in rivista)

Type

Label

Chemical mapping of individual semiconductor nanostructures (Articolo in rivista) (literal)

Anno

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Alternative label

Ratto, F; Locatelli, A; Fontana, S; Kharrazi, S; Ashtaputre, S; Kulkarni, SK; Heun, S; Rosei, F (2006)
Chemical mapping of individual semiconductor nanostructures
in Small (Weinh., Print)
(literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

Ratto, F; Locatelli, A; Fontana, S; Kharrazi, S; Ashtaputre, S; Kulkarni, SK; Heun, S; Rosei, F (literal)

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Note

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1. Univ Quebec, INRS Energie Mat & Telecommun, Varennes, PQ J3X 1S2, Canada 2. Sincrotrone Trieste SCpA, I-34012 Trieste, Italy 3. Univ Poona, Dept Phys, DST Unit Nanosci, Pune 411007, Maharashtra, India 4. Lab Nazl TASC INFM, I-34012 Trieste, Italy (literal)

Titolo

Abstract

We demonstrate experimentally the power of a novel analytical tool for X-ray spectromicroscopy. This provides a minimally intrusive elemental mapping of surfaces at the nanoscale and holds the promise of remarkable versatility. We have applied our procedure to the characterization of Ge(Si) islands on Si(111) substrates, with the aim of investigating the surface stoichiometry gradients and gaining insight into the intermixing dynamics. By identifying Si-richer edges with respect to the centers, we are able to associate alloying in these islands to surface transport processes. (literal)

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