MgS/ZnSe/GaAs structures characterisation by high resolution X-ray diffraction, topography and reflectivity methods (Comunicazione a convegno)

Type
Label
  • MgS/ZnSe/GaAs structures characterisation by high resolution X-ray diffraction, topography and reflectivity methods (Comunicazione a convegno) (literal)
Anno
  • 2006-01-01T00:00:00+01:00 (literal)
Alternative label
  • Bocchi C., Morrod J., Germini F., Nasi L., Calestani G., Prior K.A. (2006)
    MgS/ZnSe/GaAs structures characterisation by high resolution X-ray diffraction, topography and reflectivity methods
    in 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging, Karlsruhe (Germany)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Bocchi C., Morrod J., Germini F., Nasi L., Calestani G., Prior K.A. (literal)
Titolo
  • MgS/ZnSe/GaAs structures characterisation by high resolution X-ray diffraction, topography and reflectivity methods (literal)
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