spectroscopic ellipsometry
- Label
- spectroscopic ellipsometry (literal)
- Membro di
- Parole chiave di "Fabrication of barrier-type slab waveguides in Er 3+-doped tellurite glass by single and double energy MeV N + ion implantation" (Insieme di parole chiave)
- Keywords of "Doping-Induced Conductivity Transitions in Molecular Layers of Polyaniline: Optical Studies of Electronic State Changes" (Insieme di parole chiave)
- Parole chiave di "Optical properties of nanogranular and highly porous TiO2 thin films" (Insieme di parole chiave)
- Parole chiave di "Structural optical study of high-dielectric-constant oxide films" (Insieme di parole chiave)
- Value
- spectroscopic ellipsometry (literal)
Incoming links:
- Ha membro
- Keywords of "Doping-Induced Conductivity Transitions in Molecular Layers of Polyaniline: Optical Studies of Electronic State Changes" (Insieme di parole chiave)
- Parole chiave di "Structural optical study of high-dielectric-constant oxide films" (Insieme di parole chiave)
- Parole chiave di "Fabrication of barrier-type slab waveguides in Er 3+-doped tellurite glass by single and double energy MeV N + ion implantation" (Insieme di parole chiave)
- Parole chiave di "Optical properties of nanogranular and highly porous TiO2 thin films" (Insieme di parole chiave)
