BORON-DIFFUSION
- Label
- BORON-DIFFUSION (literal)
- Membro di
- Keywords of "Role of Si self-interstitials on the electrical de-activation of B doped Si" (Insieme di parole chiave)
- Parole chiave di "In situ thermal evolution of B-B pairs in crystalline Si: a spectroscopic high resolution x-ray diffraction study" (Insieme di parole chiave)
- Parole chiave di "B clustering in amorphous Si" (Insieme di parole chiave)
- Keywords of "Mechanism of de-activation and clustering of B in Si at extremely high concentration" (Insieme di parole chiave)
- Parole chiave di "Experimental evidence of B clustering in amorphous Si during ultrashallow junction formation" (Insieme di parole chiave)
- Keywords of "High-resolution X-ray diffraction by end of range defects in self-amorphized Ge" (Insieme di parole chiave)
- Keywords of "Strengths and limitations of the vacancy engineering approach for the control of dopant diffusion and activation in silicon" (Insieme di parole chiave)
- Keywords of "B diffusion and activation phenomena during post-annealing of C co-implanted ultra-shallow junctions" (Insieme di parole chiave)
- Value
- BORON-DIFFUSION (literal)
Incoming links:
- Ha membro
- Keywords of "High-resolution X-ray diffraction by end of range defects in self-amorphized Ge" (Insieme di parole chiave)
- Parole chiave di "In situ thermal evolution of B-B pairs in crystalline Si: a spectroscopic high resolution x-ray diffraction study" (Insieme di parole chiave)
- Keywords of "Strengths and limitations of the vacancy engineering approach for the control of dopant diffusion and activation in silicon" (Insieme di parole chiave)
- Keywords of "Mechanism of de-activation and clustering of B in Si at extremely high concentration" (Insieme di parole chiave)
- Parole chiave di "B clustering in amorphous Si" (Insieme di parole chiave)
- Keywords of "B diffusion and activation phenomena during post-annealing of C co-implanted ultra-shallow junctions" (Insieme di parole chiave)
- Parole chiave di "Experimental evidence of B clustering in amorphous Si during ultrashallow junction formation" (Insieme di parole chiave)
- Keywords of "Role of Si self-interstitials on the electrical de-activation of B doped Si" (Insieme di parole chiave)
