RAY PHOTOELECTRON-SPECTROSCOPY; SCANNING-TUNNELING-MICROSCOPY; SILICON-NITRIDE; SURFACE; SI(111); GROWTH
- Label
- RAY PHOTOELECTRON-SPECTROSCOPY; SCANNING-TUNNELING-MICROSCOPY; SILICON-NITRIDE; SURFACE; SI(111); GROWTH (literal)
- Membro di
- Parole chiave di "Spectro-microscopy of ultra-thin SiN films on Si (111)" (Insieme di parole chiave)
- Value
- RAY PHOTOELECTRON-SPECTROSCOPY; SCANNING-TUNNELING-MICROSCOPY; SILICON-NITRIDE; SURFACE; SI(111); GROWTH (literal)
Incoming links:
- Ha membro
- Parole chiave di "Spectro-microscopy of ultra-thin SiN films on Si (111)" (Insieme di parole chiave)
