Parole chiave di "Bulk micro defects behaviour in not-intentionally contaminated epi Si submitted to relaxation and segregation gettering"

Label

• Parole chiave di "Bulk micro defects behaviour in not-intentionally contaminated epi Si submitted to relaxation and segregation gettering" (literal)
• Keywords of "Bulk micro defects behaviour in not-intentionally contaminated epi Si submitted to relaxation and segregation gettering" (literal)

Insieme di parole chiave di

• Bulk micro defects behaviour in not-intentionally contaminated epi Si submitted to relaxation and segregation gettering (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Ha membro

• CZOCHRALSKI-GROWN SILICON (Parola chiave)
• IRON (Parola chiave)
• MECHANISMS (Parola chiave)
• IMPURITIES (Parola chiave)
• TECHNOLOGY (Parola chiave)

Incoming links:

Insieme di parole chiave

• Bulk micro defects behaviour in not-intentionally contaminated epi Si submitted to relaxation and segregation gettering (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Membro di

• IRON (Parola chiave)
• IMPURITIES (Parola chiave)
• MECHANISMS (Parola chiave)
• CZOCHRALSKI-GROWN SILICON (Parola chiave)
• TECHNOLOGY (Parola chiave)