Parole chiave di "Impact of high-kappa gate stacks on transport and variability in nano-CMOS devices"
- Label
- Parole chiave di "Impact of high-kappa gate stacks on transport and variability in nano-CMOS devices" (literal)
- Keywords of "Impact of high-kappa gate stacks on transport and variability in nano-CMOS devices" (literal)
- Insieme di parole chiave di
- Impact of high-kappa gate stacks on transport and variability in nano-CMOS devices (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Ha membro
- THIN-FILMS (Parola chiave)
- MONTE-CARLO (Parola chiave)
- SILICON INVERSION-LAYERS (Parola chiave)
- ELECTRON-MOBILITY (Parola chiave)
- QUASI-BALLISTIC TRANSPORT (Parola chiave)
Incoming links:
- Insieme di parole chiave
- Impact of high-kappa gate stacks on transport and variability in nano-CMOS devices (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Membro di
- SILICON INVERSION-LAYERS (Parola chiave)
- THIN-FILMS (Parola chiave)
- MONTE-CARLO (Parola chiave)
- ELECTRON-MOBILITY (Parola chiave)
- QUASI-BALLISTIC TRANSPORT (Parola chiave)
