Parole chiave di "Characterization of hydrogen passivated defects in strain-engineered semiconductor quantum dot structures"

Label

• Parole chiave di "Characterization of hydrogen passivated defects in strain-engineered semiconductor quantum dot structures" (literal)
• Keywords of "Characterization of hydrogen passivated defects in strain-engineered semiconductor quantum dot structures" (literal)

Insieme di parole chiave di

• Characterization of hydrogen passivated defects in strain-engineered semiconductor quantum dot structures (Articolo in rivista) (Prodotto della ricerca)

Ha membro

• semiconductor quantum dots (Parola chiave)
• photoluminescence (Parola chiave)
• electron-hole recombination (Parola chiave)
• carrier relaxation time (Parola chiave)
• passivation (Parola chiave)

Incoming links:

Insieme di parole chiave

• Characterization of hydrogen passivated defects in strain-engineered semiconductor quantum dot structures (Articolo in rivista) (Prodotto della ricerca)

Membro di

• semiconductor quantum dots (Parola chiave)
• photoluminescence (Parola chiave)
• electron-hole recombination (Parola chiave)
• passivation (Parola chiave)
• carrier relaxation time (Parola chiave)