Keywords of "A non-destructive approach for doping profiles characterization by micro-Raman spectroscopy: the case of B-implanted Ge"

Label

• Keywords of "A non-destructive approach for doping profiles characterization by micro-Raman spectroscopy: the case of B-implanted Ge" (literal)
• Parole chiave di "A non-destructive approach for doping profiles characterization by micro-Raman spectroscopy: the case of B-implanted Ge" (literal)

Insieme di parole chiave di

• A non-destructive approach for doping profiles characterization by micro-Raman spectroscopy: the case of B-implanted Ge (Articolo in rivista) (Prodotto della ricerca)

Ha membro

• Ge doping (Parola chiave)
• substitutional atoms (Parola chiave)
• B-implants Ge (Parola chiave)
• carrier concentration profiles (Parola chiave)

Incoming links:

Insieme di parole chiave

• A non-destructive approach for doping profiles characterization by micro-Raman spectroscopy: the case of B-implanted Ge (Articolo in rivista) (Prodotto della ricerca)

Membro di

• Ge doping (Parola chiave)
• substitutional atoms (Parola chiave)
• carrier concentration profiles (Parola chiave)
• B-implants Ge (Parola chiave)