Keywords of "Characterizing In and N impurities in GaAs from ab initio computer simulation of (110) cross-sectional STM images"

Label

• Keywords of "Characterizing In and N impurities in GaAs from ab initio computer simulation of (110) cross-sectional STM images" (literal)
• Parole chiave di "Characterizing In and N impurities in GaAs from ab initio computer simulation of (110) cross-sectional STM images" (literal)

Insieme di parole chiave di

• Characterizing In and N impurities in GaAs from ab initio computer simulation of (110) cross-sectional STM images (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Ha membro

• NITROGEN-ATOMS (Parola chiave)
• ALLOYS (Parola chiave)
• SURFACE (Parola chiave)
• SCANNING-TUNNELING-MICROSCOPY (Parola chiave)

Incoming links:

Insieme di parole chiave

• Characterizing In and N impurities in GaAs from ab initio computer simulation of (110) cross-sectional STM images (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Membro di

• SURFACE (Parola chiave)
• SCANNING-TUNNELING-MICROSCOPY (Parola chiave)
• ALLOYS (Parola chiave)
• NITROGEN-ATOMS (Parola chiave)