Keywords of "Characterization of Si-doped GaAs corss-sectional surfaces via ab-initio simulations"

Label

• Keywords of "Characterization of Si-doped GaAs corss-sectional surfaces via ab-initio simulations" (literal)
• Parole chiave di "Characterization of Si-doped GaAs corss-sectional surfaces via ab-initio simulations" (literal)

Insieme di parole chiave di

• Characterization of Si-doped GaAs corss-sectional surfaces via ab-initio simulations (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Ha membro

• surfaces (Parola chiave)
• doping (Parola chiave)
• semiconductors (Parola chiave)
• scanning tunneling microscopy (Parola chiave)
• ab-initio simulations (Parola chiave)

Incoming links:

Insieme di parole chiave

• Characterization of Si-doped GaAs corss-sectional surfaces via ab-initio simulations (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)

Membro di

• surfaces (Parola chiave)
• semiconductors (Parola chiave)
• doping (Parola chiave)
• scanning tunneling microscopy (Parola chiave)
• ab-initio simulations (Parola chiave)