Keywords of "Spectroscopic ellipsometry study of hydrogenated amorphous silicon carbon alloy films deposited by PECVD"

Label

• Keywords of "Spectroscopic ellipsometry study of hydrogenated amorphous silicon carbon alloy films deposited by PECVD" (literal)
• Parole chiave di "Spectroscopic ellipsometry study of hydrogenated amorphous silicon carbon alloy films deposited by PECVD" (literal)

Insieme di parole chiave di

• Spectroscopic ellipsometry study of hydrogenated amorphous silicon carbon alloy films deposited by PECVD (Articolo in rivista) (Prodotto della ricerca)

Ha membro

• OPTICAL-PROPERTIES (Parola chiave)
• SEMICONDUCTORS (Parola chiave)
• THIN-FILMS (Parola chiave)
• Si MICROSTRUCTURE (Parola chiave)
• AMORPHOUS SILICON CARBON (Parola chiave)

Incoming links:

Insieme di parole chiave

• Spectroscopic ellipsometry study of hydrogenated amorphous silicon carbon alloy films deposited by PECVD (Articolo in rivista) (Prodotto della ricerca)

Membro di

• OPTICAL-PROPERTIES (Parola chiave)
• SEMICONDUCTORS (Parola chiave)
• THIN-FILMS (Parola chiave)
• Si MICROSTRUCTURE (Parola chiave)
• AMORPHOUS SILICON CARBON (Parola chiave)