Keywords of "Nondestructive diagnostics of high-kappa dielectrics for advanced electronic devices"
- Label
- Keywords of "Nondestructive diagnostics of high-kappa dielectrics for advanced electronic devices" (literal)
- Parole chiave di "Nondestructive diagnostics of high-kappa dielectrics for advanced electronic devices" (literal)
- Insieme di parole chiave di
- Nondestructive diagnostics of high-kappa dielectrics for advanced electronic devices (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Ha membro
- ELECTRICAL-PROPERTIES (Parola chiave)
- GATE DIELECTRICS (Parola chiave)
- ATOMIC-LAYER-DEPOSITION (Parola chiave)
- OXIDE THIN-FILMS (Parola chiave)
- HFO2 FILMS (Parola chiave)
Incoming links:
- Insieme di parole chiave
- Nondestructive diagnostics of high-kappa dielectrics for advanced electronic devices (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Membro di
- ELECTRICAL-PROPERTIES (Parola chiave)
- OXIDE THIN-FILMS (Parola chiave)
- HFO2 FILMS (Parola chiave)
- GATE DIELECTRICS (Parola chiave)
- ATOMIC-LAYER-DEPOSITION (Parola chiave)
