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					<div class="scheda"><h1>Microelectronics and reliability</h1>
<dl><dt>Label</dt><dd><ul><li>Microelectronics and reliability (literal)</li></ul></dd><dt>Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi</dt><dd><ul><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID1685'>Distribution and generation of traps in SiO2/Al2O3 gate stacks (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID25373'>A new on-chip test structure for real time fatigue analysis in polysilicon MEMS (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36443'>A novel approach to characterization of progressive breakdown in high-k/metal gate stacks (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36039'>Study of nanocrystal memory integration in a Flash-like NOR device (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36034'>The influence of hydrogen and nitrogen on the formation of Si nanoclusters embedded in sub-stoichiometric silicon oxide layers (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35269'>Analysis of the effect of the gate oxide breakdown on SRAM stability (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36707'>Radiation effects in nitride read-only memories (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID53952'>Ambipolar field-effect transistor based on alpha,omega-dihexylquarterthiophene and alpha,omega diperfluoroquaterthiophene vertical heterojunction (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID37053'>An engineering approach to Bayes estimation for the Weibull distribution (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID37054'>Bayes credibility intervals for the left-truncated exponential distribution (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36064'>Reliability assessment of multi-via Cu-damascene structures by wafer-level isothermal electromigration tests (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36035'>Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36037'>Defects induced anomalous breakdown kinetics in Pr2O3 by micro- and nano-characterization (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35457'>Reliability of ultra-thin oxides in CMOS circuits (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID180770'>An improved isothermal electromigration test for Cu-damascene characterization (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID324165'>Ambipolar field-effect transistor based on ?,?- dihexylquaterthiophene and ?,?-diperfluoroquaterthiophene vertical heterojunction (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID1955'>Degradation kinetics of ultrathin HfO2 layers on Si(100) during vacuum annealing monitored with in situ XPS/LEIS and ex situ AFM (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID208016'>K-band capacitive MEMS switches on GaAs substrate: Design, fabrication, and reliability (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35616'>Structure of the oxide damage under progressive breakdown (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID25250'>A new on-chip test structure for real time fatigue analysis in polysilicon MEMS (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID32661'>Test structures for dielectric spectroscopy of thin films at microwave frequencies (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID12996'>On the reliability of instruments for environmental monitoring: some practical considerations. (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35145'>A specimen-current branching approach for FA of long Electromigration test lines (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID24702'>Silicon dioxide deposite d by ECR-PECVD for low-temperature Si devices (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35219'>Dependence of post-breakdown conduction on gate oxide thickness (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID233752'>Process dependence of BTI reliability in advanced HK MG stacks (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35656'>Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric (Articolo in rivista)</a> (Prodotto della ricerca)</li></ul></dd><dt>Alternative label</dt><dd><ul><li>Microelectronics reliability (literal)</li><li>Microelectron. reliab. (literal)</li><li>Microelectronics and reliability. (literal)</li></ul></dd><dt>Language</dt><dd><ul><li>eng (literal)</li></ul></dd><dt>Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#issn</dt><dd><ul><li>0026-2714 (literal)</li></ul></dd><dt>Preferred label</dt><dd><ul><li>Microelectronics and reliability (literal)</li></ul></dd><dt>Publisher</dt><dd><ul><li>Elsevier Oxford : GBR (literal)</li></ul></dd>

</dl>

<br/><h4>Incoming links:</h4><br/><dl><dt>Rivista</dt><dd><ul><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID1685'>Distribution and generation of traps in SiO2/Al2O3 gate stacks (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID1955'>Degradation kinetics of ultrathin HfO2 layers on Si(100) during vacuum annealing monitored with in situ XPS/LEIS and ex situ AFM (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35269'>Analysis of the effect of the gate oxide breakdown on SRAM stability (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35656'>Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36035'>Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36037'>Defects induced anomalous breakdown kinetics in Pr2O3 by micro- and nano-characterization (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36064'>Reliability assessment of multi-via Cu-damascene structures by wafer-level isothermal electromigration tests (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID12996'>On the reliability of instruments for environmental monitoring: some practical considerations. (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35145'>A specimen-current branching approach for FA of long Electromigration test lines (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35219'>Dependence of post-breakdown conduction on gate oxide thickness (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35457'>Reliability of ultra-thin oxides in CMOS circuits (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35616'>Structure of the oxide damage under progressive breakdown (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36034'>The influence of hydrogen and nitrogen on the formation of Si nanoclusters embedded in sub-stoichiometric silicon oxide layers (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36039'>Study of nanocrystal memory integration in a Flash-like NOR device (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36707'>Radiation effects in nitride read-only memories (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID24702'>Silicon dioxide deposite d by ECR-PECVD for low-temperature Si devices (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID25250'>A new on-chip test structure for real time fatigue analysis in polysilicon MEMS (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID25373'>A new on-chip test structure for real time fatigue analysis in polysilicon MEMS (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID32661'>Test structures for dielectric spectroscopy of thin films at microwave frequencies (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36443'>A novel approach to characterization of progressive breakdown in high-k/metal gate stacks (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID37053'>An engineering approach to Bayes estimation for the Weibull distribution (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID37054'>Bayes credibility intervals for the left-truncated exponential distribution (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID53952'>Ambipolar field-effect transistor based on alpha,omega-dihexylquarterthiophene and alpha,omega diperfluoroquaterthiophene vertical heterojunction (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID180770'>An improved isothermal electromigration test for Cu-damascene characterization (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID208016'>K-band capacitive MEMS switches on GaAs substrate: Design, fabrication, and reliability (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID233752'>Process dependence of BTI reliability in advanced HK MG stacks (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID324165'>Ambipolar field-effect transistor based on ?,?- dihexylquaterthiophene and ?,?-diperfluoroquaterthiophene vertical heterojunction (Articolo in rivista)</a> (Prodotto della ricerca)</li></ul></dd>

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								<a href="http://www.w3.org/DesignIssues/LinkedData.html"><img src="http://lab.linkeddata.deri.ie/2010/lod-badges/img/data-badge-5.png" alt="five star open Web data" /></a>
							</li-->
						</ul>
					</dd>
				</dl>
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