Ultramicroscopy
- Label
- Ultramicroscopy (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
- Crystal structure solution via precession electron diffraction data: The BEA algorithm (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Four slits interference and diffraction experiments (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Imaging with low-voltage scanning transmission electron microscopy: A quantitative analysis (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layers (Articolo in rivista) (Prodotto della ricerca)
- Ultrasonic force miscospy: detection and imaging of ultra-thin molecular domains (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Patterning pentacene surfaces by local oxidation nanolithography (Articolo in rivista) (Prodotto della ricerca)
- Generation of a spin-polarized electron beam by multipole magnetic fields (Articolo in rivista) (Prodotto della ricerca)
- Three dimensional analysis of the composition in solid alloys by variable probe in scanning transmission electron microscopy (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy (Articolo in rivista) (Prodotto della ricerca)
- Wide angle near-field optical probes by reverse tube etching (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Quantitative chemical evaluation of dilute GaNAs using ADF STEM: Avoiding surface strain induced artifacts (Articolo in rivista) (Prodotto della ricerca)
- STEM_CELL: A software tool for electron microscopy. Part 2 analysis of crystalline materials (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains (Articolo in rivista) (Prodotto della ricerca)
- A novel method for focus assessment in atomic resolution STEM HAADF experiments (Articolo in rivista) (Prodotto della ricerca)
- AFM structural study of the molecular chaperone GroEL and its two-dimensional crystals: an ideal \"living\" calibration sample (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Atomic force microscopy of histological sections using a chemical etching method (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- STEM_CELL: A software tool for electron microscopy: Part I-simulations (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Electron microscope calibration for the Lorentz mode (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Spectromicroscope for the PHotoelectron Imaging of Nanostructures with X-rays (SPHINX): performance in biology, medicine and geology. (Articolo in rivista) (Prodotto della ricerca)
- Force-clamp spectroscopy with a small dithering of AFM tip, and its application to explore the energy landscape of single avidin-biotin complex (Articolo in rivista) (Prodotto della ricerca)
- Alternative label
- Ultramicroscopy. (literal)
- Ultramicroscopy (literal)
- Language
- eng (literal)
- Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#issn
- 0304-3991 (literal)
- Preferred label
- Ultramicroscopy (literal)
- Publisher
- North-Holland Publ. Co. Amsterdam : NLD (literal)
Incoming links:
- Rivista
- A novel method for focus assessment in atomic resolution STEM HAADF experiments (Articolo in rivista) (Prodotto della ricerca)
- Electron microscope calibration for the Lorentz mode (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Crystal structure solution via precession electron diffraction data: The BEA algorithm (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Spectromicroscope for the PHotoelectron Imaging of Nanostructures with X-rays (SPHINX): performance in biology, medicine and geology. (Articolo in rivista) (Prodotto della ricerca)
- Patterning pentacene surfaces by local oxidation nanolithography (Articolo in rivista) (Prodotto della ricerca)
- Ultrasonic force miscospy: detection and imaging of ultra-thin molecular domains (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Wide angle near-field optical probes by reverse tube etching (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Atomic force microscopy of histological sections using a chemical etching method (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Force-clamp spectroscopy with a small dithering of AFM tip, and its application to explore the energy landscape of single avidin-biotin complex (Articolo in rivista) (Prodotto della ricerca)
- Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layers (Articolo in rivista) (Prodotto della ricerca)
- Four slits interference and diffraction experiments (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Imaging with low-voltage scanning transmission electron microscopy: A quantitative analysis (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains (Articolo in rivista) (Prodotto della ricerca)
- STEM_CELL: A software tool for electron microscopy: Part I-simulations (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- STEM_CELL: A software tool for electron microscopy. Part 2 analysis of crystalline materials (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Quantitative chemical evaluation of dilute GaNAs using ADF STEM: Avoiding surface strain induced artifacts (Articolo in rivista) (Prodotto della ricerca)
- AFM structural study of the molecular chaperone GroEL and its two-dimensional crystals: an ideal \"living\" calibration sample (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Three dimensional analysis of the composition in solid alloys by variable probe in scanning transmission electron microscopy (Articolo in rivista) (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)
- Generation of a spin-polarized electron beam by multipole magnetic fields (Articolo in rivista) (Prodotto della ricerca)
- Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy (Articolo in rivista) (Prodotto della ricerca)
