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					<div class="scheda"><h1>Journal of vacuum science & technology. B, Microelectronics and nanometer structures</h1>
<dl><dt>Label</dt><dd><ul><li>Journal of vacuum science & technology. B, Microelectronics and nanometer structures (literal)</li></ul></dd><dt>Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi</dt><dd><ul><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID177185'>Silicon laterally resonant microcantilevers for absolute pressure measurement with integrated actuation and readout (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID39854'>Investigation of a nanocrystalline silicon phase embedded in SiOx thin films grown by pulsed laser deposition (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID24685'>Analysis of stress and composition of silicon nitride thin films deposited by electron cyclotron resonance plasma-enhanced chemical vapor deposition for microfabrication processes (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID192064'>High-resolution complex structures for two-dimensional photonic crystals realized by x-ray diffraction lithography. (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID176891'>Silicon resonant microcantilevers for absolute pressure measurement (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35129'>Thermal stability of sio2/cosi2/polysilicon multilayer structures improved by cavity formation (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID233541'>Optimization of electron beam induced deposition process for the fabrication of diode-like Pt/SiO2/W devices (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34454'>Band bending and adsorption/desorption kinetics on N-polar GaN surfaces (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID172681'>Mn-induced growth of InAs nanowires (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID239743'>High-resolution depth profiling of InxGa1-xAs/GaAs multiple quantum well structures by combination of secondary ion mass spectrometry and x-ray diffraction techniques (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35599'>Assessing the performance of two-dimensional dopant profiling techniques (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID3954'>B clustering in amorphous Si (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35133'>Nanocrystal metal-oxide-semiconductor memories obtained by chemical vapor deposition of Si nanocrystals (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35188'>Two-dimensional effects on ultralow energy B implants in Si (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID187461'>Fabrication of a silicon-vacuum field-emission microdiode with a moving anode (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID170779'>Structural and electrical investigation of high temperature annealed As-implanted Si crystals (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35743'>Simulation of scanning capacitance microscopy measurements on ultranarrow doping profiles in silicon (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35684'>Environment influence on Ti diffusion and layer degradation of a SiC/Ni2Si/TiW/Au contact structure (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35139'>Triple crystal diffractometry, X-ray standing wave, and transmission electron microscopy investigation of shallow BF2 implantation in Si (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35707'>Investigation of two-dimensional diffusion of the self-interstitials in crystalline silicon at 800 degrees C and at room temperature (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID33851'>III-Nitride growth and characteristics on ferroelectric materials using plasma-assisted MBE (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID179142'>Electrochemical fabrication of cobalt and nickel tips for scanning tunneling microscopy (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID192429'>Fabrication of nickel diffractive phase elements for x-ray microscopy at 8 keV photon energy (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35291'>Redistribution and electrical activation of ultralow energy implanted boron in silicon following laser annealing (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35688'>Experimental aspects and modeling for quantitative measurements in scanning capacitance microscopy (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID33975'>Impact of unintentional and intentional nitridation of the 6H-SiC(0001)[sub Si] substrate on GaN epitaxy (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID240524'>Valence band alignment and work function of heteroepitaxial nanocrystals on GaAs(001) (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36507'>Nanoscale current transport through Schottky contacts on wide bandgap semiconductors (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID103'>Room temperature migration of boron in crystalline silicon during secondary ion mass spectrometry profiling (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID104'>Fluorine incorporation in preamorphized silicon (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID235203'>Role of low-temperature (200 degrees C) nitridation in the growth of GaN by plasma-assisted molecular-beam epitaxy (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID176290'>Investigation of growth mode behavior and surface morphology evolution of metalorganic vapor phase epitaxy grown ZnTe layers on (001) GaAs (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID240488'>Low-energy electron microscopy/x-ray magnetic circular dichroism photoemission electron microscopy study of epitaxial MnAs on GaAs (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID819'>Controlling interface reactivity and Schottky barrier height in Au/ZnSe(001) junctions (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID306225'>Ordered array of Ga droplets on GaAs(001) by local anodic oxidation (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34110'>Functionalization and characterization of InAs and InP surfaces with hemin (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34111'>Real Time Optical Monitoring of PA-MBE of InN on SiC Substrates (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36644'>High resolution medium energy ion scattering analysis for the quantitative depth profiling of ultrathin high-k layers (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34112'>In situ spectroscopic ellipsometry to monitor surface plasmon resonant group-III metals deposited by molecular beam epitaxy (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34113'>Kinetics of gallium adlayer adsorption/desorption on polar and non-polar GaN surfaces (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36555'>Dielectric thickness dependence of capacitive behavior in graphene deposited on silicon dioxide (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID203207'>\"Large area single photon detectors based on parallel configuration NbN nanowires\" (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36785'>Electrical and structural properties of ultrathin SiON films on Si prepared by plasma nitridation (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID167064'>He implantation to control B diffusion in crystalline and preamorphized Si (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34097'>Fundamental reactions controlling anion exchange during the synthesis of Sb/As mixed-anion heterojunctions (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID167153'>Scanning capacitance microscopy: Quantitative carrier profiling down to nanostructures (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID167157'>Size effects on the electrical activation of low-energy implanted B in Si (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID229986'>Investigation of two dimensional diffusion of the self-interstitials in crystalline Si at 800 °C and at room temperature (Articolo in rivista)</a> (Prodotto della ricerca)</li></ul></dd><dt>Alternative label</dt><dd><ul><li>B, (literal)</li><li>Journal of vacuum science and technology. (literal)</li><li>JVST B (literal)</li><li>Journal of vacuum science & technology. (literal)</li><li>J. vac. sci. technol., B, Microelectron. nanometer struct. (literal)</li><li>International journal devoted to microelectronics and nanometer structures : (literal)</li><li>Microelectronics and nanometer structures (literal)</li></ul></dd><dt>Language</dt><dd><ul><li>eng (literal)</li></ul></dd><dt>Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#issn</dt><dd><ul><li>1071-1023 (literal)</li></ul></dd><dt>Preferred label</dt><dd><ul><li>Journal of vacuum science & technology. B, Microelectronics and nanometer structures (literal)</li></ul></dd><dt>Publisher</dt><dd><ul><li>Published for the Society by the American Institute of Physics, New York : USA (literal)</li></ul></dd>

</dl>

<br/><h4>Incoming links:</h4><br/><dl><dt>Rivista</dt><dd><ul><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID103'>Room temperature migration of boron in crystalline silicon during secondary ion mass spectrometry profiling (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID104'>Fluorine incorporation in preamorphized silicon (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID819'>Controlling interface reactivity and Schottky barrier height in Au/ZnSe(001) junctions (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34097'>Fundamental reactions controlling anion exchange during the synthesis of Sb/As mixed-anion heterojunctions (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35133'>Nanocrystal metal-oxide-semiconductor memories obtained by chemical vapor deposition of Si nanocrystals (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35599'>Assessing the performance of two-dimensional dopant profiling techniques (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35684'>Environment influence on Ti diffusion and layer degradation of a SiC/Ni2Si/TiW/Au contact structure (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35707'>Investigation of two-dimensional diffusion of the self-interstitials in crystalline silicon at 800 degrees C and at room temperature (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35743'>Simulation of scanning capacitance microscopy measurements on ultranarrow doping profiles in silicon (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID3954'>B clustering in amorphous Si (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID24685'>Analysis of stress and composition of silicon nitride thin films deposited by electron cyclotron resonance plasma-enhanced chemical vapor deposition for microfabrication processes (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID33851'>III-Nitride growth and characteristics on ferroelectric materials using plasma-assisted MBE (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID33975'>Impact of unintentional and intentional nitridation of the 6H-SiC(0001)[sub Si] substrate on GaN epitaxy (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34110'>Functionalization and characterization of InAs and InP surfaces with hemin (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34111'>Real Time Optical Monitoring of PA-MBE of InN on SiC Substrates (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34112'>In situ spectroscopic ellipsometry to monitor surface plasmon resonant group-III metals deposited by molecular beam epitaxy (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34113'>Kinetics of gallium adlayer adsorption/desorption on polar and non-polar GaN surfaces (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35139'>Triple crystal diffractometry, X-ray standing wave, and transmission electron microscopy investigation of shallow BF2 implantation in Si (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35188'>Two-dimensional effects on ultralow energy B implants in Si (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35291'>Redistribution and electrical activation of ultralow energy implanted boron in silicon following laser annealing (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID34454'>Band bending and adsorption/desorption kinetics on N-polar GaN surfaces (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35129'>Thermal stability of sio2/cosi2/polysilicon multilayer structures improved by cavity formation (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID35688'>Experimental aspects and modeling for quantitative measurements in scanning capacitance microscopy (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36507'>Nanoscale current transport through Schottky contacts on wide bandgap semiconductors (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36555'>Dielectric thickness dependence of capacitive behavior in graphene deposited on silicon dioxide (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36644'>High resolution medium energy ion scattering analysis for the quantitative depth profiling of ultrathin high-k layers (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID36785'>Electrical and structural properties of ultrathin SiON films on Si prepared by plasma nitridation (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID39854'>Investigation of a nanocrystalline silicon phase embedded in SiOx thin films grown by pulsed laser deposition (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID167064'>He implantation to control B diffusion in crystalline and preamorphized Si (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID167153'>Scanning capacitance microscopy: Quantitative carrier profiling down to nanostructures (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID167157'>Size effects on the electrical activation of low-energy implanted B in Si (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID172681'>Mn-induced growth of InAs nanowires (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID176290'>Investigation of growth mode behavior and surface morphology evolution of metalorganic vapor phase epitaxy grown ZnTe layers on (001) GaAs (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID192429'>Fabrication of nickel diffractive phase elements for x-ray microscopy at 8 keV photon energy (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID203207'>\"Large area single photon detectors based on parallel configuration NbN nanowires\" (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID176891'>Silicon resonant microcantilevers for absolute pressure measurement (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID187461'>Fabrication of a silicon-vacuum field-emission microdiode with a moving anode (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID170779'>Structural and electrical investigation of high temperature annealed As-implanted Si crystals (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID177185'>Silicon laterally resonant microcantilevers for absolute pressure measurement with integrated actuation and readout (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID179142'>Electrochemical fabrication of cobalt and nickel tips for scanning tunneling microscopy (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID192064'>High-resolution complex structures for two-dimensional photonic crystals realized by x-ray diffraction lithography. (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID229986'>Investigation of two dimensional diffusion of the self-interstitials in crystalline Si at 800 °C and at room temperature (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID235203'>Role of low-temperature (200 degrees C) nitridation in the growth of GaN by plasma-assisted molecular-beam epitaxy (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID233541'>Optimization of electron beam induced deposition process for the fabrication of diode-like Pt/SiO2/W devices (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID239743'>High-resolution depth profiling of InxGa1-xAs/GaAs multiple quantum well structures by combination of secondary ion mass spectrometry and x-ray diffraction techniques (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID240488'>Low-energy electron microscopy/x-ray magnetic circular dichroism photoemission electron microscopy study of epitaxial MnAs on GaAs (Articolo in rivista)</a> (Prodotto della ricerca)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID240524'>Valence band alignment and work function of heteroepitaxial nanocrystals on GaAs(001) (Articolo in rivista)</a> (http://www.cnr.it/ontology/cnr/individuo/prodotto/TIPO1101)</li><li><a href='http://www.cnr.it/ontology/cnr/individuo/prodotto/ID306225'>Ordered array of Ga droplets on GaAs(001) by local anodic oxidation (Articolo in rivista)</a> (Prodotto della ricerca)</li></ul></dd>

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