AFM Imaging via Nonlinear Control of Self-Driven Cantilever Oscillations (Articolo in rivista)

Type
Label
  • AFM Imaging via Nonlinear Control of Self-Driven Cantilever Oscillations (Articolo in rivista) (literal)
Anno
  • 2011-01-01T00:00:00+01:00 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi
  • 10.1109/TNANO.2010.2051815 (literal)
Alternative label
  • Michele Basso (1); Paolo Paoletti (2); Bruno Tiribilli (3); Massimo Vassalli (4) (2011)
    AFM Imaging via Nonlinear Control of Self-Driven Cantilever Oscillations
    in IEEE transactions on nanotechnology; The Institute of Electrical and Electronics Engineers (IEEE), Piscataway (Stati Uniti d'America)
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Michele Basso (1); Paolo Paoletti (2); Bruno Tiribilli (3); Massimo Vassalli (4) (literal)
Pagina inizio
  • 560 (literal)
Pagina fine
  • 565 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#url
  • http://ieeexplore.ieee.org/ (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume
  • 10 (literal)
Rivista
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali
  • 6 (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroFascicolo
  • 3 (literal)
Note
  • ISI Web of Science (WOS) (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni
  • 1) Dipartimento di Sistemi e Informatica, University of Florence, Florence I-50139, Italy 2) Dipartimento di Sistemi e Informatica, University of Florence, Florence I-50139, Italy and Institute for Complex Systems, National Research Council, Florence I-50019, Italy 3) Institute for Complex Systems, National Research Council, Florence I-50019, Italy 4) Institute of Biophysics, National Research Council, Genoa I-16149, Italy (literal)
Titolo
  • AFM Imaging via Nonlinear Control of Self-Driven Cantilever Oscillations (literal)
Abstract
  • The need for investigating the properties of new materials at nanoscale level continuously pushes the development of higher resolution measurement instruments. In this context, a promising dynamic atomic force microscopy setup, where the cantilever gets excited by a nonlinear feedback loop, has been recently introduced. In the first part of the paper, the application of this working mode to imaging is experimentally investigated, showing the effectiveness of this novel approach. Furthermore, the presence of a variable saturation in the nonlinear loop is exploited to design a specific algorithm that dynamically adapts the cantilever free oscillation amplitude to sudden variations of the sample profile. In imaging applications, this additional control action significantly reduces the tip-sample interaction force yet maintaining high image quality, thus resulting in a suitable setup for better preserving the state of soft and damageable samples such as biological specimens. (literal)
Editore
Prodotto di
Autore CNR
Insieme di parole chiave

Incoming links:


Prodotto
Autore CNR di
Editore di
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi
Insieme di parole chiave di
data.CNR.it