A 2-dimensional Wavelet based approach to recognise defects in C-scan maps (Contributo in atti di convegno)

Type
Label
  • A 2-dimensional Wavelet based approach to recognise defects in C-scan maps (Contributo in atti di convegno) (literal)
Anno
  • 2004-01-01T00:00:00+01:00 (literal)
Alternative label
  • Bozzi E.; Cavaccini G.; Chimenti M.; Di Bono M.G.; Salvetti O. (2004)
    A 2-dimensional Wavelet based approach to recognise defects in C-scan maps
    in 7th International Conference on Pattern Recognition and Image Analysis: New Information Technologies, St. Petersburg
    (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori
  • Bozzi E.; Cavaccini G.; Chimenti M.; Di Bono M.G.; Salvetti O. (literal)
Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#note
  • October, 18-23, 2004. Proceedings, Vol. II, pp. 627-630. Yuri I. Zhuravlev (ed.). St. Petersburg Electrotechnical University, 2004. (literal)
Titolo
  • A 2-dimensional Wavelet based approach to recognise defects in C-scan maps (literal)
Prodotto di
Autore CNR

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