Conductive atomic force microscopy and Scanning impedance microscopy for the imaging of electrical domain in CaCu3Ti4O12 perovskite oxide (Contributo in atti di convegno)

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Label
  • Conductive atomic force microscopy and Scanning impedance microscopy for the imaging of electrical domain in CaCu3Ti4O12 perovskite oxide (Contributo in atti di convegno) (literal)
Anno
  • 2010-01-01T00:00:00+01:00 (literal)
Alternative label
  • Lo Nigro R, Fiorenza P, Raineri V (2010)
    Conductive atomic force microscopy and Scanning impedance microscopy for the imaging of electrical domain in CaCu3Ti4O12 perovskite oxide
    in Mater. Res. Soc. Symp. Proc. Volume 1232E, Warrendale, PA, 2010), MRS Symposium Proceeding, Vol. 1232, 1232-OO07-01, 2010, Boston, USA
    (literal)
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  • Lo Nigro R, Fiorenza P, Raineri V (literal)
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  • Recently, studies on the calcium copper titanate, CaCu3Ti4O12 (CCTO), have revealed that this material possesses an impressive giant dielectric constant value of 105 times the vacuum permittivity µ0 at 1MHz, which remains constant in the 100-600 K temperature range and depends slightly on the frequency in the 102-105 Hz range. In addition, CCTO does not show ferroelectric transition. These interesting properties render the CCTO a real attractive alternative material to the currently used ferroelectrics which in turn possess lower dielectric constant values having stronger temperature dependence. The presence of domains with different electrical characteristic represent one of the most important and possible explanation for the extrinsic origin of the CCTO colossal dielectric response. This paper reports on the electrical characterization of CCTO ceramics with scanning probe based techniques. Previous works highlighted the importance of scanning probe microscopy (SPM) based techniques to investigate the conduction and insulating behaviours of heterogynous materials. In this context, conductive atomic force microscopy and scanning impedance microscopy have been used to demonstrate the presence, shape and size in CCTO ceramics, having different grains dimension, of the different electrically domains, both at the grain boundaries and within the grains. In particular, the possibility to extrapolate the electrical characteristics of the single grain and of the single domain has been evaluated considering the insulating grain embedded in a conductive matrix. Furthermore, the conductivity of both the insulating and conductive domains has been obtained. (literal)
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  • ISI Web of Science (WOS) (literal)
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  • CNR IMM, Catania, Italy (literal)
Titolo
  • Conductive atomic force microscopy and Scanning impedance microscopy for the imaging of electrical domain in CaCu3Ti4O12 perovskite oxide (literal)
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