Detection of heterogeneities in single-crystal CaCu3Ti4O12 using Conductive Atomic Force Microscopy (Contributo in atti di convegno)

Type

• Prodotto della ricerca (Classe)
• Contributo in atti di convegno (Classe)

Label

• Detection of heterogeneities in single-crystal CaCu3Ti4O12 using Conductive Atomic Force Microscopy (Contributo in atti di convegno) (literal)

Anno

• 2010-01-01T00:00:00+01:00 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#doi

• 10.1088/1757-899X/8/1/012018 (literal)

Alternative label

• Fiorenza P, Lo Nigro R, Raineri V, Krohns S, Lunkenheimer P, Loidl A, Ebbinghaus SG, Ferrarelli MC (2010)
  Detection of heterogeneities in single-crystal CaCu3Ti4O12 using Conductive Atomic Force Microscopy
  in Conference on Fundamentals and Technology of Multifunctional Oxide Thin Films (Symposium G, EMRS 2009 Spring Meeting) Strasbourg, FRANCE, JUN 08-12, 2009, Strasburgo
  (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#autori

• Fiorenza P, Lo Nigro R, Raineri V, Krohns S, Lunkenheimer P, Loidl A, Ebbinghaus SG, Ferrarelli MC (literal)

Pagina inizio

• 012018-1 (literal)

Pagina fine

• 012018-4 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#titoloVolume

• Fundamentals and Technology of multifunctional oxide thin films (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#numeroVolume

• 8 (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#volumeInCollana

• 8 (literal)

Rivista

• IOP conference series. Materials science and engineering (Rivista)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#pagineTotali

• 4 (literal)

Note

• ISI Web of Science (WOS) (literal)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#affiliazioni

• CNR, Ist Microelettron & Microsistemi, I-95121 Catania, Italy University of Schieffield University of Augusburg (literal)

Titolo

• Detection of heterogeneities in single-crystal CaCu3Ti4O12 using Conductive Atomic Force Microscopy (literal)

Abstract

• This paper reports on a conductive atomic force microscopy (C-AFM) investigation to provide local electrical characterization in a single crystal of CaCu3Ti4O12 (CCTO). The microstructure and dielectric properties were studied and provide evidence for an insulating secondary phase embedded within the semiconducting CCTO matrix. Such insulating electrical heterogeneities cannot be observed with macroscopic measurements such as conventional Impedance Spectroscopy and this study reveals C-AFM to be a powerful tool to assess the electrical homogeneity of semiconducting single crystals such as CCTO. (literal)

Editore

• IOP Publishing Ltd. (Institute of Physics Publishing Ltd) (Editore)

Prodotto di

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Materiali multifunzionali, e innovativi per componenti integrati (MD.P05.003.002) (Modulo)

Autore CNR

• RAFFAELLA LO NIGRO (Unità di personale interno)
• PATRICK FIORENZA (Persona)
• VITO RAINERI (Persona)

Incoming links:

Autore CNR di

• VITO RAINERI (Persona)
• RAFFAELLA LO NIGRO (Unità di personale interno)
• PATRICK FIORENZA (Persona)

Prodotto

• Institute for microelectronics and microsystems (IMM) (Istituto)
• Materiali multifunzionali, e innovativi per componenti integrati (MD.P05.003.002) (Modulo)

Http://www.cnr.it/ontology/cnr/pubblicazioni.owl#rivistaDi

• IOP conference series. Materials science and engineering (Rivista)

Editore di

• IOP Publishing Ltd. (Institute of Physics Publishing Ltd) (Editore)